Author : Derrick Todd Carpenter
Publisher :
Page : 360 pages
File Size : 26,88 MB
Release : 1998
Category : Polycrystalline semiconductors
ISBN :
Materials properties often depend critically on microstructure, especially in polycrystalline thin films. Improvements in characterization techniques are necessary to improve our understanding of structure-property relationships. In this work, we develop improvements for the quantitative measurement of grain boundary segregation, crystallographic texture, and the grain size distribution.
Author : Jason Thomas Herrold
Publisher :
Page : 142 pages
File Size : 12,92 MB
Release : 1998
Category :
ISBN :
Next several experiments are conducted which establish a relation between processing parameters and the material properties of the resulting films. The processing parameters explored are the dilution of the process gasses, the temperature of the substrate, the type of substrate deposited on, the incident microwave power, and the chamber pressure during deposition. The optical, structural, and electrical properties of the films are characterized by UV/VIS/NIR Spectroscopy, Raman spectroscopy, x-ray diffraction, x-ray photoelectron spectroscopy, activation energy determination, photoreflectance spectroscopy and photosensitivity. The emphasis of the work is to establish basic material knowledge of a relatively new system and how processing parameters can be used to generate the desired material properties.
Author : Mowafak Al-Jassim
Publisher : Institution of Engineering and Technology
Page : 457 pages
File Size : 20,95 MB
Release : 2020-09-17
Category : Technology & Engineering
ISBN : 1839530235
Polycrystalline thin-film solar cells have reached a levelized cost of energy that is competitive with all other sources of electricity. The technology has significantly improved in recent years, with laboratory cell efficiencies for cadmium telluride (CdTe), perovskites, and copper indium gallium diselenide (CIGS) each exceeding 22 percent. Both CdTe and CIGS solar panels are now produced at the gigawatt scale. However, there are ongoing challenges, including the continued need to improve performance and stability while reducing cost. Advancing polycrystalline solar cell technology demands an in-depth understanding of efficiency, scaling, and degradation mechanisms, which requires sophisticated characterization methods. These methods will enable researchers and manufacturers to improve future solar modules and systems.
Author : Michael Jay Tarlov
Publisher :
Page : 324 pages
File Size : 28,24 MB
Release : 1987
Category :
ISBN :
Author : Mario Birkholz
Publisher : John Wiley & Sons
Page : 378 pages
File Size : 18,29 MB
Release : 2006-05-12
Category : Technology & Engineering
ISBN : 3527607048
With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.
Author : Jean-Jacques Joseph Hajjar
Publisher :
Page : 278 pages
File Size : 29,40 MB
Release : 1985
Category :
ISBN :
Author : Harold J. Frost
Publisher : Materials Research Society
Page : 0 pages
File Size : 14,3 MB
Release : 1996-09-20
Category : Technology & Engineering
ISBN : 9781558993068
This interdisciplinary book brings together researchers from a wide range of scientific fields to offer insights into the nature of polycrystalline thin films. These films have properties that are different from those of a bulk polycrystal and from those of a single crystal film. In particular, the volume focuses on film deposition and processing techniques which allow the fabrication of films with innovative microstructures and technologically relevant properties. The work presented ranges from theoretical studies to technological applications. Topics include: microstructural evolution; interfaces and mechanical properties; characterization of microstructure; hard and refractory films; polycrystalline silicon; electrical properties; optical properties; gas sensors; ferroelectric films; metallization; and magnetic and MEMS applications.
Author : Brent L. Adams
Publisher : Materials Research Society
Page : 0 pages
File Size : 10,4 MB
Release : 1997-11-25
Category : Technology & Engineering
ISBN : 9781558993761
Thin films are used in virtually every manufacturing and technological area. A large fraction of these films are polycrystalline. Their uses range from critical components in the microelectronics industry, to hard coatings for wear resistance, corrosion resistance and thermal barriers, to magnetic, optical and medical applications. It is essential to the functional properties of these films that the microstructure, composition, architecture and stress state be produced with a high level of control which demands a detailed understanding of the mechanisms which are responsible for the formation of structure in polycrystalline thin films. This book focuses on thin polycrystalline metallic, ceramic and semiconducting films of thicknesses in the range of tens to thousands of nanometers. Topics range from fundamental to technological. Topics include: evolution of texture and microstructure; grain boundaries and interfaces; microstructure, stress and texture; characterization and representation; microstructure, texture and reliability; processing, characterization and application and polycrystalline Si and SiGe films.
Author : Abraham Ulman
Publisher : Butterworth-Heinemann
Page : 302 pages
File Size : 38,52 MB
Release : 1995
Category : Science
ISBN :
Characterization of Organic Thin Films will help materials scientists, physicists, chemists, and biologists develop a fundamental understanding of structure-properties relationships which in turn makes possible molecular engineering of advanced materials and opens new opportunities in molecular manufacturing.
Author : Manuel P. Soriaga
Publisher : Springer Science & Business Media
Page : 362 pages
File Size : 49,20 MB
Release : 2012-12-06
Category : Science
ISBN : 1461507758
This book is about thin films; what they are, how they are prepared, how they are characterized, and what they are used for. The contents of this book not only showcase the diversity of thin films, but also reveals the commonality among the work performed in a variety of areas. The chapters in this volume are based on invited papers presented by prominent researchers in the field at a Symposium on "Thin Films: Preparation, Characterization, Applications" at the 221st National Meeting of the American Chemical Society held in San Diego, California. The coverage of the symposium was extensive; topics ranged from highly-ordered metal adlayers on well-defined electrode surfaces to bio-organic films on non-metallic nanoparticles. An objective of this book is for the readers to be able to draw from the experience and results of others in order to improve and expand the understanding of the science and technology of their own thin films systems.
