Introduction to Surface Roughness and Scattering
Author : Jean M. Bennett
Publisher :
Page : 128 pages
File Size : 11,26 MB
Release : 1989
Category : Science
ISBN :
Author : Jean M. Bennett
Publisher :
Page : 128 pages
File Size : 11,26 MB
Release : 1989
Category : Science
ISBN :
Author :
Publisher :
Page : pages
File Size : 12,20 MB
Release : 1998
Category :
ISBN : 9781557525635
Author : Alexei A. Maradudin
Publisher : Springer Science & Business Media
Page : 513 pages
File Size : 18,36 MB
Release : 2010-05-10
Category : Science
ISBN : 0387356592
This book covers both experimental and theoretical aspects of nanoscale light scattering and surface roughness. Topics include: spherical particles located on a substrate; surface and buried interface roughness; surface roughness of polymer thin films; magnetic and thermal fluctuations at planar surfaces; speckle patterns; scattering of electromagnetic waves from a metal; multiple wavelength light scattering; nanoroughness standards.
Author : John C. Stover
Publisher : SPIE-International Society for Optical Engineering
Page : 0 pages
File Size : 27,13 MB
Release : 2012
Category : Light
ISBN : 9780819492517
The first edition of this book concentrated on relating scatter from optically smooth surfaces to the microroughness on those surfaces. After spending six years in the semiconductor industry, Dr. Stover has updated and expanded the third edition. Newly included are scatter models for pits and particles as well as the use of wafer scanners to locate and size isolated surface features. New sections cover the multimillion-dollar wafer scanner business, establishing that microroughness is the noise, not the signal, in these systems. Scatter measurements, now routinely used to determine whether small-surface features are pits or particles and inspiring new technology that provides information on particle material, are also discussed. These new capabilities are now supported by a series of international standards, and a new chapter reviews those documents. New information on scatter from optically rough surfaces has also been added. Once the critical limit is exceeded, scatter cannot be used to determine surface-roughness statistics, but considerable information can still be obtained - especially when measurements are made on mass-produced products. Changes in measurement are covered, and the reader will find examples of scatter measurements made using a camera for a fraction of the cost and in a fraction of the time previously possible. The idea of relating scatter to surface appearance is also discussed, and appearance has its own short chapter. After all, beauty is in the eye of the beholder, and what we see is scattered light.
Author : Zu-Han Gu
Publisher : Society of Photo Optical
Page : 382 pages
File Size : 44,76 MB
Release : 1998
Category : Technology & Engineering
ISBN : 9780819428813
Author :
Publisher :
Page : pages
File Size : 26,89 MB
Release : 1992
Category :
ISBN : 9781557522610
Author :
Publisher :
Page : pages
File Size : 14,73 MB
Release : 1998
Category :
ISBN :
Author : Zu-Han Gu
Publisher : SPIE-International Society for Optical Engineering
Page : 0 pages
File Size : 32,85 MB
Release : 1997
Category : Science
ISBN : 9780819425638
Author : National Science Foundation (U.S.)
Publisher :
Page : 133 pages
File Size : 41,53 MB
Release : 1992
Category : Light
ISBN : 9781557522610
Author : Richard Leach
Publisher : Springer Science & Business Media
Page : 333 pages
File Size : 29,54 MB
Release : 2011-03-31
Category : Technology & Engineering
ISBN : 3642120121
The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.