Materials Reliability in Microelectronics IV
Author : Materials Research Society. Spring Meeting
Publisher :
Page : 666 pages
File Size : 31,15 MB
Release : 1994
Category : Electrodiffusion
ISBN :
Author : Materials Research Society. Spring Meeting
Publisher :
Page : 666 pages
File Size : 31,15 MB
Release : 1994
Category : Electrodiffusion
ISBN :
Author : D. Caillard
Publisher : Elsevier
Page : 453 pages
File Size : 45,63 MB
Release : 2003-09-08
Category : Technology & Engineering
ISBN : 0080542786
KEY FEATURES: - A unified, fundamental and quantitative resource. The result of 5 years of investigation from researchers around the world - New data from a range of new techniques, including synchrotron radiation X-ray topography provide safer and surer methods of identifying deformation mechanisms - Informing the future direction of research in intermediate and high temperature processes by providing original treatment of dislocation climb DESCRIPTION: Thermally Activated Mechanisms in Crystal Plasticity is a unified, quantitative and fundamental resource for material scientists investigating the strength of metallic materials of various structures at extreme temperatures. Crystal plasticity is usually controlled by a limited number of elementary dislocation mechanisms, even in complex structures. Those which determine dislocation mobility and how it changes under the influence of stress and temperature are of key importance for understanding and predicting the strength of materials. The authors describe in a consistent way a variety of thermally activated microscopic mechanisms of dislocation mobility in a range of crystals. The principles of the mechanisms and equations of dislocation motion are revisited and new ones are proposed. These describe mostly friction forces on dislocations such as the lattice resistance to glide or those due to sessile cores, as well as dislocation cross-slip and climb. They are critically assessed by comparison with the best available experimental results of microstructural characterization, in situ straining experiments under an electron or a synchrotron beam, as well as accurate transient mechanical tests such as stress relaxation experiments. Some recent attempts at atomistic modeling of dislocation cores under stress and temperature are also considered since they offer a complementary description of core transformations and associated energy barriers. In addition to offering guidance and assistance for further experimentation, the book indicates new ways to extend the body of data in particular areas such as lattice resistance to glide.
Author : Siegfried Schmauder
Publisher : Springer
Page : 0 pages
File Size : 23,6 MB
Release : 2019-05-09
Category : Science
ISBN : 9789811068836
This book provides a comprehensive reference for the studies of mechanical properties of materials over multiple length and time scales. The topics include nanomechanics, micromechanics, continuum mechanics, mechanical property measurements, and materials design. The handbook employs a consistent and systematic approach offering readers a user friendly reference ideal for frequent consultation. It is appropriate for an audience at of graduate students, faculties, researchers, and professionals in the fields of Materials Science, Mechanical Engineering, Civil Engineering, Engineering Mechanics, and Aerospace Engineering.
Author :
Publisher :
Page : 1074 pages
File Size : 38,38 MB
Release : 1979
Category : Aeronautics
ISBN :
Author : Michael J. Zehetbauer
Publisher : John Wiley & Sons
Page : 872 pages
File Size : 44,23 MB
Release : 2006-03-06
Category : Technology & Engineering
ISBN : 3527604944
These proceedings of the "Second International Conference on Nanomaterials by Severe Plastic Deformation" review the enormous scientific avalanche that has been developing in the field over recent years. A valuable resource for any scientist and engineer working in this emerging field of nanotechnology.
Author :
Publisher :
Page : 606 pages
File Size : 27,61 MB
Release : 1993
Category : Metallurgy
ISBN :
Author : David Tabor
Publisher : Oxford University Press
Page : 196 pages
File Size : 37,63 MB
Release : 2000-08-03
Category : Science
ISBN : 9780198507765
This book is an attempt to explain hardness measurements of metals in terms of some of their more basic physical properties. The intention is to provide, for physicists, engineers, and metallurgists, a better understanding of what hardness means and what hardness measurements imply. The author emphasises the physical concepts involved, so that non-mathematical readers can grasp and appreciate the general physical picture without needing to follow the more detailed mathematical treatment.
Author : Adam J. Schwartz
Publisher : Springer Science & Business Media
Page : 406 pages
File Size : 33,90 MB
Release : 2010-03-11
Category : Technology & Engineering
ISBN : 0387881360
Electron backscatter diffraction is a very powerful and relatively new materials characterization technique aimed at the determination of crystallographic texture, grain boundary character distributions, lattice strain, phase identification, and much more. The purpose of this book is to provide the fundamental basis for electron backscatter diffraction in materials science, the current state of both hardware and software, and illustrative examples of the applications of electron backscatter diffraction to a wide-range of materials including undeformed and deformed metals and alloys, ceramics, and superconductors. The text has been substantially revised from the first edition, and the authors have kept the format as close as possible to the first edition text. The new developments covered in this book include a more comphrensive coverage of the fundamentals not covered in the first edition or other books in the field, the advances in hardware and software since the first edition was published, and current examples of application of electron backscatter diffraction to solve challenging problems in materials science and condensed-matter physics.
Author :
Publisher :
Page : 940 pages
File Size : 36,58 MB
Release : 1997
Category : Aeronautics
ISBN :
Author : C. Barry Carter
Publisher : Springer
Page : 543 pages
File Size : 47,54 MB
Release : 2016-08-24
Category : Technology & Engineering
ISBN : 3319266519
This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.