Istfa 2005
Author : ASM International
Publisher : ASM International
Page : 524 pages
File Size : 46,51 MB
Release : 2005-01-01
Category : Technology & Engineering
ISBN : 1615030883
ISTFA 2006
Author : Electronic Device Failure Analysis Society
Publisher : ASM International
Page : 524 pages
File Size : 13,6 MB
Release : 2006
Category : Technology & Engineering
ISBN : 1615030891
Book Description
ISTFA 2010
Author :
Publisher : ASM International
Page : 487 pages
File Size : 19,89 MB
Release : 2010-01-01
Category : Technology & Engineering
ISBN : 1615037276
Book Description
Thirty-fourth International Symposium for Testing and Failure Analysis
Author : ASM International
Publisher : ASM International
Page : 551 pages
File Size : 34,13 MB
Release : 2008-01-01
Category : Electronic apparatus and appliances
ISBN : 1615030913
Book Description
ISTFA 2007 Proceedings of the 33rd International Symposium for Testing and Failure Analysis
Author : ASM International
Publisher : ASM International
Page : 372 pages
File Size : 12,11 MB
Release : 2007-01-01
Category : Technology & Engineering
ISBN : 1615030905
Book Description
Printbegrænsninger: Der kan printes 10 sider ad gangen og max. 40 sider pr. session
ISTFA 2012
Author : ASM International
Publisher : ASM International
Page : 643 pages
File Size : 14,86 MB
Release : 2012
Category : Technology & Engineering
ISBN : 1615039953
Book Description
ISTFA 2005
Author : ASM International
Publisher : ASM International(OH)
Page : 523 pages
File Size : 42,4 MB
Release : 2005
Category : Science
ISBN : 9780871708236
Book Description
ISTFA 2013
Author : A. S. M. International
Publisher : ASM International
Page : 634 pages
File Size : 34,19 MB
Release : 2013-01-01
Category : Technology & Engineering
ISBN : 1627080228
Book Description
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.
ISTFA 2011
Author :
Publisher : ASM International
Page : 479 pages
File Size : 23,28 MB
Release : 2011
Category : Technology & Engineering
ISBN : 1615038507
Book Description
ISTFA 2018: Proceedings from the 44th International Symposium for Testing and Failure Analysis
Author :
Publisher : ASM International
Page : pages
File Size : 38,83 MB
Release : 2018-12-01
Category :
ISBN : 1627080996
Book Description
The International Symposium for Testing and Failure Analysis (ISTFA) 2018 is co-located with the International Test Conference (ITC) 2018, October 28 to November 1, in Phoenix, Arizona, USA at the Phoenix Convention Center. The theme for the November 2018 conference is "Failures Worth Analyzing." While technology advances fast and the market demands the latest and the greatest, successful companies strive to stay competitive and remain profitable.
