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Applied Polymer Light Microscopy

Author : Derek A. Hemsley

Publisher : Springer Science & Business Media

Page : 317 pages

File Size : 37,26 MB

Release : 2012-12-06

Category : Science

ISBN : 9401174741

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Book Description

Synthetic polymers make excellent specimens for light microscopy. Despite this, the use of the technique, at least in its advanced forms, is not so widespread as might be expected. Although reliable and relevant data are difficult to find and quantify, it seems that in other fields of materials science and technology there is a greater readiness to tum to the microscope in research, in industrial problem solving, or for quality assessment and control. It also seems that the reasons for the present situation are partly historical, partly the result of the structure of the plastics and rubber industries, and partly the education and training background of senior staff who tend to be chemistry or engineering based. In neither field does light microscopy feature strongly in the basic training. The primary aim of this book is to provide some insight into the range oflight microscopy techniques applicable to polymeric specimens, and to highlight typical applications to commercial polymers and polymer products. Where appropriate, the optical techniques involved are discussed in some detail. However, it has not been the intention to produce a light microscopy textbook dealing with the principles and design of the basic instrument. Many such texts are available, and selected examples are cited in the reference list at the end of most chapters.



The Microscope

Author : Simon Henry Gage

Publisher :

Page : 344 pages

File Size : 41,76 MB

Release : 1904

Category : Histology

ISBN :

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Advanced Computing in Electron Microscopy

Author : Earl J. Kirkland

Publisher : Springer Science & Business Media

Page : 289 pages

File Size : 50,53 MB

Release : 2010-08-12

Category : Science

ISBN : 1441965335

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Book Description

Preface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition. New topics include aberration corrected instruments, scanning confocal mode of operations, Bloch wave eigenvalue methods and parallel computing techniques. The ?rst edition - cluded a CD with computer programs, which is not included in this edition. - stead the associated programs will be available on an associated web site (currently people.ccmr.cornell.edu/ ̃kirkland,but may move as time goes on). I wish to thank Mick Thomas for preparing the specimen used to record the image in Fig.5.26 and to thank Stephen P. Meisburger for suggesting an interesting biological specimen to use in Fig.7.24. Again, I apologize in advance for leaving out some undoubtedlyoutstanding r- erences. I also apologize for the as yet undiscovered errors that remain in the text. Earl J. Kirkland, December 2009 Preface to First Edition Image simulation has become a common tool in HREM (High Resolution El- tron Microscopy) in recent years. However, the literature on the subject is scattered among many different journals and conference proceedings that have occurred in the last two or three decades. It is dif?cult for beginners to get started in this ?eld.



Field Guide to Microscopy

Author : Tomasz S. Tkaczyk

Publisher : SPIE-International Society for Optical Engineering

Page : 162 pages

File Size : 41,40 MB

Release : 2010

Category : Science

ISBN :

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Book Description

This guide provides extensive coverage of microscopic imaging principles. After reviewing the main principles of image formation, diffraction, interference, and polarization used in microscopy, this guide describes the most widely applied microscope configurations and applications. It also covers major system components, including light sources, illumination layouts, microscope optics, and image detection electronics. This guide also provides a comprehensive overview of microscopy techniques, including bright field and dark field imaging, contrast enhancement methods (such as phase and amplitude contrast), DIC, polarization, and fluorescence microscopy. In addition, it describes scanning techniques (such as confocal and multiphoton imaging points); new trends in super-resolution methods (such as 4Pi microscopy, STED, STORM, and structured illumination); and array microscopy, CARS, and SPIM.





Scanning Probe Microscopy¿in Industrial Applications

Author : Dalia G. Yablon

Publisher : John Wiley & Sons

Page : 337 pages

File Size : 19,8 MB

Release : 2013-10-24

Category : Technology & Engineering

ISBN : 111872304X

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Book Description

Describes new state-of-the-science tools and their contribution to industrial R&D With contributions from leading international experts in the field, this book explains how scanning probe microscopy is used in industry, resulting in improved product formulation, enhanced processes, better quality control and assurance, and new business opportunities. Readers will learn about the use of scanning probe microscopy to support R&D efforts in the semiconductor, chemical, personal care product, biomaterial, pharmaceutical, and food science industries, among others. Scanning Probe Microscopy in Industrial Applications emphasizes nanomechanical characterization using scanning probe microscopy. The first half of the book is dedicated to a general overview of nanomechanical characterization methods, offering a complete practical tutorial for readers who are new to the topic. Several chapters include worked examples of useful calculations such as using Hertz mechanics with and without adhesion to model a contact, step-by-step instructions for simulations to guide cantilever selection for an experiment, and data analysis procedures for dynamic contact experiments. The second half of the book describes applications of nanomechanical characterization in industry, including: New formulation development for pharmaceuticals Measurement of critical dimensions and thin dielectric films in the semiconductor industry Effect of humidity and temperature on biomaterials Characterization of polymer blends to guide product formulation in the chemicals sector Unraveling links between food structure and function in the food industry Contributions are based on the authors' thorough review of the current literature as well as their own firsthand experience applying scanning probe microscopy to solve industrial R&D problems. By explaining the fundamentals before advancing to applications, Scanning Probe Microscopy in Industrial Applications offers a complete treatise that is accessible to both novices and professionals. All readers will discover how to apply scanning probe microscopy to build and enhance their R&D efforts.