Leakage in Nanometer CMOS Technologies


Book Description

Covers in detail promising solutions at the device, circuit, and architecture levels of abstraction after first explaining the sensitivity of the various MOS leakage sources to these conditions from the first principles. Also treated are the resulting effects so the reader understands the effectiveness of leakage power reduction solutions under these different conditions. Case studies supply real-world examples that reap the benefits of leakage power reduction solutions as the book highlights different device design choices that exist to mitigate increases in the leakage components as technology scales.




Efficient Design of Variation-Resilient Ultra-Low Energy Digital Processors


Book Description

This book enables readers to achieve ultra-low energy digital system performance. The author’s main focus is the energy consumption of microcontroller architectures in digital (sub)-systems. The book covers a broad range of topics extensively: from circuits through design strategy to system architectures. The result is a set of techniques and a context to realize minimum energy digital systems. Several prototype silicon implementations are discussed, which put the proposed techniques to the test. The achieved results demonstrate an extraordinary combination of variation-resilience, high speed performance and ultra-low energy.




Low Power Digital CMOS Design


Book Description

Power consumption has become a major design consideration for battery-operated, portable systems as well as high-performance, desktop systems. Strict limitations on power dissipation must be met by the designer while still meeting ever higher computational requirements. A comprehensive approach is thus required at all levels of system design, ranging from algorithms and architectures to the logic styles and the underlying technology. Potentially one of the most important techniques involves combining architecture optimization with voltage scaling, allowing a trade-off between silicon area and low-power operation. Architectural optimization enables supply voltages of the order of 1 V using standard CMOS technology. Several techniques can also be used to minimize the switched capacitance, including representation, optimizing signal correlations, minimizing spurious transitions, optimizing sequencing of operations, activity-driven power down, etc. The high- efficiency of DC-DC converter circuitry required for efficient, low-voltage and low-current level operation is described by Stratakos, Sullivan and Sanders. The application of various low-power techniques to a chip set for multimedia applications shows that orders-of-magnitude reduction in power consumption is possible. The book also features an analysis by Professor Meindl of the fundamental limits of power consumption achievable at all levels of the design hierarchy. Svensson, of ISI, describes emerging adiabatic switching techniques that can break the CV2f barrier and reduce the energy per computation at a fixed voltage. Srivastava, of AT&T, presents the application of aggressive shut-down techniques to microprocessor applications.




Low-Power High-Level Synthesis for Nanoscale CMOS Circuits


Book Description

This self-contained book addresses the need for analysis, characterization, estimation, and optimization of the various forms of power dissipation in the presence of process variations of nano-CMOS technologies. The authors show very large-scale integration (VLSI) researchers and engineers how to minimize the different types of power consumption of digital circuits. The material deals primarily with high-level (architectural or behavioral) energy dissipation.




Low-Power CMOS Circuits


Book Description

The power consumption of microprocessors is one of the most important challenges of high-performance chips and portable devices. In chapters drawn from Piguet's recently published Low-Power Electronics Design, Low-Power CMOS Circuits: Technology, Logic Design, and CAD Tools addresses the design of low-power circuitry in deep submicron technologies. It provides a focused reference for specialists involved in designing low-power circuitry, from transistors to logic gates. The book is organized into three broad sections for convenient access. The first examines the history of low-power electronics along with a look at emerging and possible future technologies. It also considers other technologies, such as nanotechnologies and optical chips, that may be useful in designing integrated circuits. The second part explains the techniques used to reduce power consumption at low levels. These include clock gating, leakage reduction, interconnecting and communication on chips, and adiabatic circuits. The final section discusses various CAD tools for designing low-power circuits. This section includes three chapters that demonstrate the tools and low-power design issues at three major companies that produce logic synthesizers. Providing detailed examinations contributed by leading experts, Low-Power CMOS Circuits: Technology, Logic Design, and CAD Tools supplies authoritative information on how to design and model for high performance with low power consumption in modern integrated circuits. It is a must-read for anyone designing modern computers or embedded systems.




Low Power Design in Deep Submicron Electronics


Book Description

Decreasing power dissipation per logic function has become a primary concern in virtually all CMOS system chips designed today as a result of the relentless progress in processing technology that has led us into the deep-submicron age. Evolution from 1 micron to 0.1 micron lithography in the next decade will not be possible without a change in the way we design CMOS systems. But power reduction requires an overall optimisation, ranging from software compilation over instruction set design down to the introduction of much more parallelism in the architecture, the optimal use of memory hierarchy, new clocking strategies, use of asynchronous techniques, new CMOS circuit techniques and management of leakage currents in new low power technologies. Moreover, performance and power dissipation will come to be dominated by interconnect and thus completely new floor planning and place and route strategies are emerging. The chapters in this book present a systematic coverage of deep submicron CMOS digital system design for low power, from process technology all the way up to software design and embedded software systems. Audience: An excellent guide for the practising engineer, researcher and student interested in this crucial aspect of actual CMOS design.




Leakage in Nanometer CMOS Technologies


Book Description

Covers in detail promising solutions at the device, circuit, and architecture levels of abstraction after first explaining the sensitivity of the various MOS leakage sources to these conditions from the first principles. Also treated are the resulting effects so the reader understands the effectiveness of leakage power reduction solutions under these different conditions. Case studies supply real-world examples that reap the benefits of leakage power reduction solutions as the book highlights different device design choices that exist to mitigate increases in the leakage components as technology scales.




Design of Variation-tolerant Circuits for Nanometer CMOS Technology


Book Description

Aggressive scaling of CMOS technology in sub-90nm nodes has created huge challenges. Variations due to fundamental physical limits, such as random dopants fluctuation (RDF) and line edge roughness (LER) are increasing significantly with technology scaling. In addition, manufacturing tolerances in process technology are not scaling at the same pace as transistor's channel length due to process control limitations (e.g., sub-wavelength lithography). Therefore, within-die process variations worsen with successive technology generations. These variations have a strong impact on the maximum clock frequency and leakage power for any digital circuit, and can also result in functional yield losses in variation-sensitive digital circuits (such as SRAM). Moreover, in nanometer technologies, digital circuits show an increased sensitivity to process variations due to low-voltage operation requirements, which are aggravated by the strong demand for lower power consumption and cost while achieving higher performance and density. It is therefore not surprising that the International Technology Roadmap for Semiconductors (ITRS) lists variability as one of the most challenging obstacles for IC design in nanometer regime. To facilitate variation-tolerant design, we study the impact of random variations on the delay variability of a logic gate and derive simple and scalable statistical models to evaluate delay variations in the presence of within-die variations. This work provides new design insight and highlights the importance of accounting for the effect of input slew on delay variations, especially at lower supply voltages.




VLSI Design and Test


Book Description

This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.