Low-Energy Ion Irradiation of Solid Surfaces
Author : Hubert Gnaser
Publisher : Springer
Page : 304 pages
File Size : 50,87 MB
Release : 2014-01-15
Category :
ISBN : 9783662147382
Low Energy Ion-Surface Interactions
Author : J. Wayne Rabalais
Publisher : John Wiley & Sons
Page : 624 pages
File Size : 25,39 MB
Release : 1994-05-09
Category : Science
ISBN :
Book Description
Low Energy Ion--Surface Interactions Edited by J. Wayne Rabalais, University of Houston, Texas, USA Recent advances in experimental techniques and theoretical methodologies mean that increasingly detailed and sophisticated studies of state--or energy--selected molecular ions can now be performed. Each volume in this series will be dedicated to reviewing a specific topic, emphasizing new experimental and theoretical developments in the study of ions. This volume details the current understanding of Low Energy Ion--Surface Interactions, along with some of the novel applications. Each of the ten chapters is authored by active researchers in the field who are at the forefront of research in their particular areas. This up-to-date compilation, detailing developments occurring within the last five years, will be particularly useful to researchers and teachers involved with Low Energy Ion--Surface Interactions.
Ion-Solid Interactions
Author : Michael Nastasi
Publisher : Cambridge University Press
Page : 572 pages
File Size : 29,46 MB
Release : 1996-03-29
Category : Science
ISBN : 052137376X
Book Description
Comprehensive guide to an important materials science technique for students and researchers.
Low-Energy Ion Irradiation of Materials
Author : Bernd Rauschenbach
Publisher : Springer Nature
Page : 763 pages
File Size : 20,48 MB
Release : 2022-08-19
Category : Technology & Engineering
ISBN : 3030972771
Book Description
This book provides a comprehensive introduction to all aspects of low-energy ion–solid interaction from basic principles to advanced applications in materials science. It features a balanced and insightful approach to the fundamentals of the low-energy ion–solid surface interaction, focusing on relevant topics such as interaction potentials, kinetics of binary collisions, ion range, radiation damages, and sputtering. Additionally, the book incorporates key updates reflecting the latest relevant results of modern research on topics such as topography evolution and thin-film deposition under ion bombardment, ion beam figuring and smoothing, generation of nanostructures, and ion beam-controlled glancing angle deposition. Filling a gap of almost 20 years of relevant research activity, this book offers a wealth of information and up-to-date results for graduate students, academic researchers, and industrial scientists working in these areas.
Characterization of Nanoparticles
Author : Vasile-Dan Hodoroaba
Publisher : Elsevier
Page : 564 pages
File Size : 34,10 MB
Release : 2019-09-24
Category : Science
ISBN : 0128141824
Book Description
Characterization of Nanoparticles: Measurement Processes for Nanoparticles surveys this fast growing field, including established methods for the physical and chemical characterization of nanoparticles. The book focuses on sample preparation issues (including potential pitfalls), with measurement procedures described in detail. In addition, the book explores data reduction, including the quantitative evaluation of the final result and its uncertainty of measurement. The results of published inter-laboratory comparisons are referred to, along with the availability of reference materials necessary for instrument calibration and method validation. The application of these methods are illustrated with practical examples on what is routine and what remains a challenge. In addition, this book summarizes promising methods still under development and analyzes the need for complementary methods to enhance the quality of nanoparticle characterization with solutions already in operation.
Inelastic Energy Transfer In Interactions With Surfaces And Adsorbates
Author : B Gumhalter
Publisher : World Scientific
Page : 258 pages
File Size : 24,79 MB
Release : 1993-11-30
Category :
ISBN : 9814553352
Book Description
The aim of this volume is to underline common aspects of dynamical properties of surfaces and adsorbates which can sustain energy transfer and to assess the role and importance of specific energy and charge transfer mechanisms in constituting the properties of surface and adsorbate electronic, vibronic, photoabsorption and similar spectra, the dynamics of adsorption/desorption and trapping processes, surface scattering phenomena involving electrons, ions or neutral particles etc. In this regard, special attention has been paid to model descriptions and discussions of inelastic interactions, screening and charge transfer processes encountered in XPS, AES, EELS, NEXAFS and electron, atomic/molecular and ion beam scattering experiments.
Ion Surface Interaction, Sputtering and Related Phenomena
Author : Rainer Behrisch
Publisher :
Page : 346 pages
File Size : 50,64 MB
Release : 1973
Category : Science
ISBN :
Book Description
Fundamentals of Gas-Surface Interactions
Author : Howard Saltsburg
Publisher : Elsevier
Page : 568 pages
File Size : 47,40 MB
Release : 2013-10-22
Category : Science
ISBN : 1483270637
Book Description
Fundamentals of Gas–Surface Interactions presents the study of the surface itself and the study of the gas phase partner of the interaction in which physical or chemical transformation of the gas resulted from that interaction. This book discusses the study of the energy and momentum exchanges resulting from the gas–solid physical interaction in which either gas or solid phase properties can be measured. Organized into three parts encompassing 33 chapters, this book begins with an overview of the different sensitive physical methods for the study of surface topography, surface defects, and surface irregularities to an accuracy of a few Angstroms. This text then reviews the adsorption at very low coverage that has yielded to equilibrium analysis. Other chapters consider the measurement of surface area by adsorption and optical techniques. The final chapter deals with scattering processes including momentum and energy transfer. This book is a valuable resource for engineers.
Plasma-Surface Interactions and Processing of Materials
Author : O. Auciello
Publisher : Springer Science & Business Media
Page : 548 pages
File Size : 31,49 MB
Release : 2012-12-06
Category : Science
ISBN : 9400919468
Book Description
An understanding of the processes involved in the basic and applied physics and chemistry of the interaction of plasmas with materials is vital to the evolution of technologies such as those relevant to microelectronics, fusion and space. The subjects dealt with in the book include: the physics and chemistry of plasmas, plasma diagnostics, physical sputtering and chemical etching, plasma assisted deposition of thin films, ion and electron bombardment, and plasma processing of inorganic and polymeric materials. The book represents a concentration of a substantial amount of knowledge acquired in this area - knowledge which was hitherto widely scattered throughout the literature - and thus establishes a baseline reference work for both established and tyro research workers.
An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
Author : Sarah Fearn
Publisher : Morgan & Claypool Publishers
Page : 67 pages
File Size : 13,27 MB
Release : 2015-10-16
Category : Technology & Engineering
ISBN : 1681740885
Book Description
This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.
