Fringe Pattern Analysis for Optical Metrology


Book Description

The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.




Optical Metrology for Fluids, Combustion and Solids


Book Description

Optical Metrology for Fluids, Combustion and Solids is the first practical handbook that presents the assemblage of the techniques necessary to provide a basic understanding of optical measurement for fluids, combustion, and solids. The use of light as a measurement tool has grown over the past twenty years from a narrowly specialized activity to a mainstay of modern research today. Until recently, the knowledge that could be extracted from the light interaction of light with physical objects was limited to specialized activities. The invention of the laser, the computer and microelectronics has enabled a measurement revolution such that virtually every parameter of engineering interest can be measured using the minimally intrusive properties of light. The authors of this book's chapters are leaders in this revolution. They work on the front lines of research in government, industry, and universities, inventing yet more ways to harness the power of light for the generation of knowledge.




Fringe Pattern Analysis for Optical Metrology


Book Description

The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.




Advances in Speckle Metrology and Related Techniques


Book Description

Speckle metrology includes various optical techniques that are based on the speckle fields generated by reflection from a rough surface or by transmission through a rough diffuser. These techniques have proven to be very useful in testing different materials in a non-destructive way. They have changed dramatically during the last years due to the development of modern optical components, with faster and more powerful digital computers, and novel data processing approaches. This most up-to-date overview of the topic describes new techniques developed in the field of speckle metrology over the last decade, as well as applications to experimental mechanics, material science, optical testing, and fringe analysis.




Handbook of Optical Dimensional Metrology


Book Description

Due to their speed, data density, and versatility, optical metrology tools play important roles in today's high-speed industrial manufacturing applications. Handbook of Optical Dimensional Metrology provides useful background information and practical examples to help readers understand and effectively use state-of-the-art optical metrology methods




Optical Metrology


Book Description

Proceedings of the NATO Advanced Study Institute held in Viana do Castelo, Portugal, July 16-27, 1984




Optical Metrology for Precision Engineering


Book Description

This book provides readers the fundamentals of optical metrology for precision engineering. The next-generation measurement technologies based on ultrashort pulse laser and optical frequency comb are also presented, making it an essential reference book for various engineering fields. • Introduces fundamental theories and techniques • Combines theories with practical applications • Presents technologies in an easy-to-understand way




Interferometers


Book Description

This book presents readers with the latest research in interferometry. Chapters include research done on an approach that can be used to identify the performance of coherence scanning interferometers in the presence of vibration; the permeability engineering of semiconductor photonic devices; several interferometric structures based on bulk optics to achieving optical interleaving; interference lithography; recent results on laser surface patterning using interferometers and femtosecond laser radiation; the realisation of the optical interferometers with the optical MEMS technology; a simple two-ray interferometer tuned by rotation; tuning of interference pattern period by rotation of an interferometer itself; the characteristics of a two-ray interferometer with fixed mirrors; the detection of acoustic fields from bounded ultrasonic beams by using laser interferometry techniques; and the use of lateral shearing interferometry as an important area of general interferometry.




Speckle Metrology


Book Description

This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the processing of PIV records, and the design requirements of PIV equipment; discusses the applications of white light speckle methods and the production of artificial speckles; describes the measurement of surface roughness with laser speckles and polychromatic speckles; illustrates semiautomatic and automatic methods for the analysis of Young's fringes; calculates the variation of Young's fringes with the change in the microrelief of the rough surface; and explicates hololenses for imaging and provides design details with aberration corrections for hololense systems.;With over 1500 literature citations, tables, figures and display equations, Speckle Metrology is a resource for students and professionals in the fields of optical, mechanical, electrical and electronics engineering; applied physics; and stress analysis.