Microscopy and Microanalysis 1998
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Page : 1194 pages
File Size : 24,41 MB
Release : 1998
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Page : 1194 pages
File Size : 24,41 MB
Release : 1998
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Page : pages
File Size : 44,23 MB
Release : 1998
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Page : pages
File Size : 10,11 MB
Release : 1998
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Author : G. W. Bailey
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Page : 1194 pages
File Size : 34,78 MB
Release : 1998
Category : Microchemistry
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Author : G.W. Bailey
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Page : pages
File Size : 18,57 MB
Release : 1998
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Author : Microscopy Society of America
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Page : 136 pages
File Size : 17,31 MB
Release : 1998
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Author : Australian Key Centre for Microscopy and Microanalysis
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Page : pages
File Size : 21,46 MB
Release : 1998
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Author : Ludwig Reimer
Publisher : Springer
Page : 538 pages
File Size : 37,19 MB
Release : 2013-11-11
Category : Science
ISBN : 3540389679
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
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Page : 153 pages
File Size : 43,6 MB
Release : 1998
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Author : G. W. Bailey
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Page : pages
File Size : 11,2 MB
Release : 1999
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