Proceedings
Author : G. William Bailey
Publisher :
Page : 1207 pages
File Size : 34,35 MB
Release : 2000
Category :
ISBN :
Author : G. William Bailey
Publisher :
Page : 1207 pages
File Size : 34,35 MB
Release : 2000
Category :
ISBN :
Author : G. W. Bailey
Publisher :
Page : 1207 pages
File Size : 39,9 MB
Release : 2000
Category :
ISBN :
Author :
Publisher :
Page : 1207 pages
File Size : 27,58 MB
Release : 2000
Category :
ISBN :
Author : G. W. Bailey
Publisher :
Page : pages
File Size : 43,66 MB
Release : 2000
Category :
ISBN :
Author : G.W. Bailey
Publisher :
Page : pages
File Size : 46,21 MB
Release : 2000
Category :
ISBN :
Author : Microscopy Society of America. Meeting
Publisher :
Page : 1207 pages
File Size : 36,65 MB
Release : 2000
Category : Microchemistry
ISBN :
Author : Microscopy Society of America. Meeting
Publisher :
Page : 124 pages
File Size : 34,79 MB
Release : 2000
Category :
ISBN :
Author : Microscopy Society of America
Publisher : Cambridge University Press
Page : 556 pages
File Size : 42,23 MB
Release : 2002-12-16
Category : Science
ISBN : 9780521824057
This Proceedings volume contains extended abstracts of all the papers presented by microscopists in both the materials and life sciences at the Microscopy and Microanalysis 2002 meeting held in Québec City, Québec, Canada on August 4-9, 2002. The Proceedings consists of both a printed volume containing the extended abstracts of all invited papers as well as a searchable CD-ROM containing the extended abstracts of all papers presented at the meeting --whether invited or submitted, platform or poster.
Author :
Publisher :
Page : 722 pages
File Size : 10,45 MB
Release : 2005
Category : Microscopy
ISBN :
Author : M. Aindow
Publisher : CRC Press
Page : 548 pages
File Size : 27,22 MB
Release : 2001-12-01
Category : Science
ISBN : 1482289512
Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Electron Microscopy and Analysis 2001 presents a useful snapshot of the latest developments in instrumentation, analysis techniques, and applications of electron and scanning probe microscopies. The book is ideal for