Book Description
Proceedings of 2005 International Conference on Advanced Manufacture, held in Taipei, Taiwan, R.O.C., November 28th - December 2nd, 2005
Author : Wunyuh Jywe
Publisher : Trans Tech Publications Ltd
Page : 1342 pages
File Size : 10,9 MB
Release : 2006-01-15
Category : Technology & Engineering
ISBN : 3038130559
Proceedings of 2005 International Conference on Advanced Manufacture, held in Taipei, Taiwan, R.O.C., November 28th - December 2nd, 2005
Author : Guido Tosello
Publisher : MDPI
Page : 274 pages
File Size : 46,86 MB
Release : 2019-05-31
Category : Technology & Engineering
ISBN : 3039210343
The continuous miniaturization of products and the growing complexity of their embedded multifunctionalities necessitates continuous research and development efforts regarding micro components and related micro manufacturing technologies. Highly miniaturized systems, manufactured using a wide variety of materials, have found application in key technological fields, such as healthcare devices, micro implants, mobility, communications, optics, and micro electromechanical systems. Innovations required for the high-precision manufacturing of micro components can specifically be achieved through optimizations using post-process (i.e., offline) and in-process (i.e., online) metrology of both process input and output parameters, as well as geometrical features of the produced micro parts. However, it is of critical importance to reduce the metrology and optimization efforts, since process and product quality control can represent a significant portion of the total production time in micro manufacturing. To solve this fundamental challenge, research efforts have been undertaken in order to define, investigate, implement, and validate the so-called “product/process manufacturing fingerprint” concept. The “product manufacturing fingerprint” concept refers to those unique dimensional outcomes (e.g., surface topography, form error, critical dimensions, etc.) on the produced component that, if kept under control and within specifications, ensure that the entire micro component complies to its specifications. The “process manufacturing fingerprint” is a specific process parameter or feature to be monitored and controlled, in order to maintain the manufacture of products within the specified tolerances. By integrating both product and process manufacturing fingerprint concepts, the metrology and optimization efforts are highly reduced. Therefore, the quality of the micro products increases, with an obvious improvement in production yield. Accordingly, this Special Issue seeks to showcase research papers, short communications, and review articles that focus on novel methodological developments and applications in micro- and sub-micro-scale manufacturing, process monitoring and control, as well as micro and sub-micro product quality assurance. Focus will be on micro manufacturing process chains and their micro product/process fingerprint, towards full process optimization and zero-defect micro manufacturing.
Author : Yi Qin
Publisher : William Andrew
Page : 859 pages
File Size : 12,28 MB
Release : 2015-05-08
Category : Technology & Engineering
ISBN : 0323312675
Micromanufacturing Engineering and Technology, Second Edition, covers the major topics of micro-manufacturing. The book not only covers theory and manufacturing processes, but it uniquely focuses on a broader range of practical aspects of micro-manufacturing engineering and utilization by also covering materials, tools and equipment, manufacturing system issues, control aspects and case studies. By explaining material selection, design considerations and economic aspects, the book empowers engineers in choosing among competing technologies. With a focus on low-cost and high-volume micro-manufacturing processes, the updated title covers technologies such as micro-mechanical-cutting, laser-machining, micro-forming, micro-EDM, micro-ECM, hot-embossing, micro-injection molding, laser micro-sintering, thin film fabrication, inkjet technology, micro-joining, multiple processes machines, and more. Edited by one of the few world-experts in this relatively new, but rapidly-expanding area and presenting chapters written by a 40-strong team of leading industry specialists, this book is an invaluable source of information for engineers, R&D researchers and academics. - Covers key micro-manufacturing technologies, processes and equipment with high-volume production capabilities, enabling large companies as well as SMEs to introduce those technologies in production and business and reduce production costs - Outlines micro-manufacturing system engineering and practical issues pertaining to material, design, handling, metrology, inspection, testing, sensors, control, system integration and software, and micro-factories - Enables manufacturing practitioners to choose the right technology suitable for a particular product-manufacture
Author : Günter Wilkening
Publisher : John Wiley & Sons
Page : 541 pages
File Size : 24,46 MB
Release : 2006-05-12
Category : Technology & Engineering
ISBN : 3527606874
The quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar "NanoScale 2004" (6th Seminar on Quantitative Microscopy and 2nd Seminar on Nanoscale Calibration Standards and Methods) at the National Metrology Institute (Physikalisch-Technische Bundesanstalt PTB), Braunschweig, Germany, continues the series of seminars on Quantitative Microscopy. The series stimulates the exchange of information between manufacturers of relevant hard- and software and the users in science and industry. Topics addressed in these proceedings are a) the application of quantitative measurements and measurement problems in: microelectronics, microsystems technology, nano/quantum/molecular electronics, chemistry, biology, medicine, environmental technology, materials science, surface processing b) calibration & correction methods: calibration methods, calibration standards, calibration procedures, traceable measurements, standardization, uncertainty of measurements c) instrumentation and methods: novel/improved instruments and methods, reproducible probe/sample positioning, position-measuring systems, novel/improved probe/detector systems, linearization methods, image processing
Author : Lihui Wang
Publisher : Springer Science & Business Media
Page : 401 pages
File Size : 37,61 MB
Release : 2008-02-28
Category : Technology & Engineering
ISBN : 1848001479
This book presents a collection of quality chapters on the state-of-the-art of research efforts in the area of smart devices and novel machine design, as well as their practical applications to enable advanced manufacturing. The first section presents a broad-based review of several key areas of research in smart devices and machines. The second section is focused on presenting an in-depth treatment of a particular device or machine. The book will be of interest to a broad readership.
Author : Wolfgang Osten
Publisher : Springer Science & Business Media
Page : 808 pages
File Size : 35,44 MB
Release : 2010-04-28
Category : Technology & Engineering
ISBN : 3642030513
21 years ago it was a joint idea with Hans Rottenkolber to organize a workshop dedicated to the discussion of the latest results in the automatic processing of fringe patterns. This idea was promoted by the insight that automatic and high precision phase measurement techniques will play a key role in all future industrial and scientific applications of optical metrology. A couple of months later more than 50 specialists from East and West met in East Berlin, the capital of the former GDR, to spend 3 days with the discussion of new principles of fringe processing. In the stimulating atmoshere the idea was born to repeat the workshop and to organize the meeting in an olympic schedule. And thus meanwhile 20 years have been passed and we have today Fringe number six. However, such a workshop takes place in a dynamic environment. Therefore the main topics of the previous events were always adapted to the most interesting subjects of the new period. In 1993 the workshop took place in Bremen and was dedicated to new principles of optical shape measurement, setup calibration, phase unwrapping and nondestructive testing, while in 1997 new approaches in multi-sensor metrology, active measurement strategies and hybrid processing technologies played a central role. 2001, the first meeting in the 21st century, was focused to optical methods for micromeasurements, hybrid measurement technologies and new sensor solutions for industrial inspection.
Author : Richard Leach
Publisher : Elsevier
Page : 384 pages
File Size : 18,42 MB
Release : 2014-05-17
Category : Science
ISBN : 1455777501
Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. Richard Leach introduces these techniques to a broad audience of engineers and scientists involved in nanotechnology and manufacturing applications and research. He also provides a routemap and toolkit for metrologists engaging with the rigor of measurement and data analysis at the nano-scale. Starting from the fundamentals of precision measurement, the author progresses into different measurement and characterization techniques. The focus on nanometrology in engineering contexts makes this book an essential guide for the emerging nanomanufacturing / nanofabrication sector, where measurement and standardization requirements are paramount both in product specification and quality assurance. This book provides engineers and scientists with the methods and understanding needed to design and produce high-performance, long-lived products while ensuring that compliance and public health requirements are met. Updated to cover new and emerging technologies, and recent developments in standards and regulatory frameworks, this second edition includes many new sections, e.g. new technologies in scanning probe and e-beam microscopy, recent developments in interferometry and advances in co-ordinate metrology. - Demystifies nanometrology for a wide audience of engineers, scientists, and students involved in nanotech and advanced manufacturing applications and research - Introduces metrologists to the specific techniques and equipment involved in measuring at the nano-scale or to nano-scale uncertainty - Fully updated to cover the latest technological developments, standards, and regulations
Author :
Publisher :
Page : 794 pages
File Size : 42,34 MB
Release : 2007
Category : Microelectromechanical systems
ISBN :
Author : Stephanus Büttgenbach
Publisher : Springer Science & Business Media
Page : 447 pages
File Size : 42,84 MB
Release : 2011-03-04
Category : Technology & Engineering
ISBN : 364212903X
This book presents the design and manufacturing of microsystems as well as necessary key technologies developed within the Collaborative Research Center 516. The research efforts of this collaboration are focused on active micro systems which are based on the electromagnetic actuator principle. The travel of the investigated actuator systems is on the order of several millimeters. The total construction size of the actuator is on the range of several centimeters whereas essential structures being several micrometers. The methods and the production technologies that are investigated on the basis of various research models incorporate the fundamental process chains of microsystems.
Author : Yuri V. Chugui
Publisher : Trans Tech Publications Ltd
Page : 654 pages
File Size : 27,37 MB
Release : 2010-05-20
Category : Technology & Engineering
ISBN : 3038133558
Selected Papers of the 9th International Symposium on Measurement Technology and Intelligent Instruments ( ISMTII-2009 ), June 29 - July 2, 2009, Saint-Petersburg, Russia