Native and Transition Metal Defect Centers in Indium Phosphide
Author : Alan Paul Constant
Publisher :
Page : pages
File Size : 16,47 MB
Release : 1987
Category :
ISBN :
Author : Alan Paul Constant
Publisher :
Page : pages
File Size : 16,47 MB
Release : 1987
Category :
ISBN :
Author :
Publisher :
Page : 1812 pages
File Size : 26,45 MB
Release : 1992
Category : Physics
ISBN :
Author :
Publisher :
Page : 532 pages
File Size : 45,72 MB
Release : 1987
Category : Dissertation abstracts
ISBN :
Author : Nickolay T. Bagraev
Publisher : Trans Tech Publications Ltd
Page : 691 pages
File Size : 21,92 MB
Release : 1993-01-01
Category : Technology & Engineering
ISBN : 3035702985
This volume focuses on current theoretical and experimental investigations of defects in III-V and II-VI compounds, silicon, germanium, Si-Ge alloys, and amorphous semiconductors. The discussions also address the metastability and superconductivity induced by point defects, dislocations and processing in semiconductors. An important feature of this book are the special papers on defects in SiC and IV-VI compounds, and the contributions on hot topics such as nonequilibrium diffusion, negative-U defects and several new techniques.
Author : H.J. von Bardeleben
Publisher : Trans Tech Publications Ltd
Page : 1320 pages
File Size : 37,9 MB
Release : 1986-01-01
Category : Technology & Engineering
ISBN : 3035704244
Materials Science Forum Vols. 10-12
Author :
Publisher :
Page : 1252 pages
File Size : 31,35 MB
Release : 1989
Category : Dissertations, Academic
ISBN :
Author : Joshua Pelleg
Publisher : Springer Nature
Page : 342 pages
File Size : 17,43 MB
Release :
Category :
ISBN : 3031216598
Author : Northwestern University (Evanston, Ill.). Materials Research Center
Publisher :
Page : 280 pages
File Size : 34,34 MB
Release : 1987
Category : Materials
ISBN :
Author :
Publisher :
Page : 988 pages
File Size : 19,8 MB
Release : 1988
Category : Nuclear energy
ISBN :
Author : Noble M. Johnson
Publisher :
Page : 630 pages
File Size : 38,84 MB
Release : 1985
Category : Technology & Engineering
ISBN :