Book Description
A comprehensive tutorial on techniques and interpreting results in experiments concerning radiation technologies such as ion implantation, ion beam mixing, etc. and the effects of radiation on thin surface layers of metals and other materials. Reviews the fundamental features of rapid nuclear analysis methods, such as Rutherford backscattering and channeling, in conjunction with changes of ion energy, ion-induced x-ray emission, and nuclear microanalysis. Also presents the results of the authors' original research into the mechanisms of damage and structural transformations in multicomponent and multilayer structures and in ion-irradiated GaAs and Ni single crystals, and the processes of defect interaction in collision cascades. Originally published in Russian in 1987. Book club price, $84. Annotation copyrighted by Book News, Inc., Portland, OR