On-wafer Calibration Techniques at Millimeter Wave Frequencies and Cryogenic Temperatures
Author : Matt Y. Nishimoto
Publisher :
Page : 112 pages
File Size : 45,38 MB
Release : 1995
Category : Calibration
ISBN :
Author : Matt Y. Nishimoto
Publisher :
Page : 112 pages
File Size : 45,38 MB
Release : 1995
Category : Calibration
ISBN :
Author : Andrej Rumiantsev
Publisher : CRC Press
Page : 279 pages
File Size : 23,51 MB
Release : 2022-09-01
Category : Technology & Engineering
ISBN : 1000792854
The increasing demand for more content, services, and security drives the development of high-speed wireless technologies, optical communication, automotive radar, imaging and sensing systems and many other mm-wave and THz applications. S-parameter measurement at mm-wave and sub-mm wave frequencies plays a crucial role in the modern IC design debug. Most importantly, however, is the step of device characterization for development and optimization of device model parameters for new technologies. Accurate characterization of the intrinsic device in its entire operation frequency range becomes extremely important and this task is very challenging. This book presents solutions for accurate mm-wave characterization of advanced semiconductor devices. It guides through the process of development, implementation and verification of the in-situ calibration methods optimized for high-performance silicon technologies. Technical topics discussed in the book include: Specifics of S-parameter measurements of planar structures Complete mathematical solution for lumped-standard based calibration methods, including the transfer Thru-Match-Reflect (TMR) algorithms Design guideline and examples for the on-wafer calibration standards realized in both advanced SiGe BiCMOS and RF CMOS processes Methods for verification of electrical characteristics of calibration standards and accuracy of the in-situ calibration results Comparison of the new technique vs. conventional approaches: the probe-tip calibration and the pad parasitic de-embedding for various device types, geometries and model parameters New aspects of the on-wafer RF measurements at mmWave frequency range and calibration assurance.
Author : Andrej Rumiantsev
Publisher :
Page : 0 pages
File Size : 26,67 MB
Release : 2014
Category :
ISBN :
Author : Andrej Rumiantsev
Publisher : Electronic Materials and Devic
Page : 0 pages
File Size : 12,21 MB
Release : 2019-05-30
Category : Technology & Engineering
ISBN : 9788770221122
The increasing demand for more content, services, and security drives the development of high-speed wireless technologies, optical communication, automotive radar, imaging and sensing systems and many other mm-wave and THz applications. S-parameter measurement at mm-wave and sub-mm wave frequencies plays a crucial role in the modern IC design debug. Most importantly, however, is the step of device characterization for development and optimization of device model parameters for new technologies. Accurate characterization of the intrinsic device in its entire operation frequency range becomes extremely important and this task is very challenging. This book presents solutions for accurate mm-wave characterization of advanced semiconductor devices. It guides through the process of development, implementation and verification of the in-situ calibration methods optimized for high-performance silicon technologies. Technical topics discussed in the book include: Specifics of S-parameter measurements of planar structures Complete mathematical solution for lumped-standard based calibration methods, including the transfer Thru-Match-Reflect (TMR) algorithms Design guideline and examples for the on-wafer calibration standards realized in both advanced SiGe BiCMOS and RF CMOS processes Methods for verification of electrical characteristics of calibration standards and accuracy of the in-situ calibration results Comparison of the new technique vs. conventional approaches: the probe-tip calibration and the pad parasitic de-embedding for various device types, geometries and model parameters New aspects of the on-wafer RF measurements at mmWave frequency range and calibration assurance.
Author :
Publisher :
Page : 842 pages
File Size : 27,94 MB
Release : 1995
Category : Chemistry
ISBN :
Reports NIST research and development in the physical and engineering sciences in which the Institute is active. These include physics, chemistry, engineering, mathematics, and computer sciences. Emphasis on measurement methodology and the basic technology underlying standardization.
Author : Stephen A. Dyer
Publisher : John Wiley & Sons
Page : 1096 pages
File Size : 40,5 MB
Release : 2004-04-07
Category : Technology & Engineering
ISBN : 0471221651
In-depth coverage of instrumentation and measurement from the Wiley Encyclopedia of Electrical and Electronics Engineering The Wiley Survey of Instrumentation and Measurement features 97 articles selected from the Wiley Encyclopedia of Electrical and Electronics Engineering, the one truly indispensable reference for electrical engineers. Together, these articles provide authoritative coverage of the important topic of instrumentation and measurement. This collection also, for the first time, makes this information available to those who do not have access to the full 24-volume encyclopedia. The entire encyclopedia is available online-visit www.interscience.wiley.com/EEEE for more details. Articles are grouped under sections devoted to the major topics in instrumentation and measurement, including: * Sensors and transducers * Signal conditioning * General-purpose instrumentation and measurement * Electrical variables * Electromagnetic variables * Mechanical variables * Time, frequency, and phase * Noise and distortion * Power and energy * Instrumentation for chemistry and physics * Interferometers and spectrometers * Microscopy * Data acquisition and recording * Testing methods The articles collected here provide broad coverage of this important subject and make the Wiley Survey of Instrumentation and Measurement a vital resource for researchers and practitioners alike
Author :
Publisher :
Page : 456 pages
File Size : 47,81 MB
Release : 1999
Category : Microwave devices
ISBN : 9780862131524
Author : National Institute of Standards and Technology (U.S.)
Publisher :
Page : 406 pages
File Size : 37,98 MB
Release : 1988
Category :
ISBN :
Author : Edmar Camargo
Publisher : Artech House
Page : 339 pages
File Size : 22,7 MB
Release : 2022-05-31
Category : Technology & Engineering
ISBN : 163081945X
This book gives you – in one comprehensive and practical resource -- everything you need to successfully design modern and sophisticated power amplifiers at mmWave frequencies. The book provides an in-depth treatment of the design methodology for MMIC power amplifiers, then brings you step by step through the various phases of design, from the selection of technology and preliminary architecture considerations, to the effective design of the matching circuits and conversion of electrical-to-electromagnetic models. Detailed figures and numerous practical applications are included to help you gain valuable insights into these technologies and learn to identify the best path to a successful design. You’ll be guided through a range of new mmWave power applications that show particular promise to support new 5G systems, while mastering the use of GaN technology that continues to dominate the power mmWave applications due to its high power, gain, and efficiency. This is a valuable resource for power amplifier design engineers, technicians, industry R&D staff, and anyone getting into the area of power MMICs who wants to learn how to design at mmWave frequencies.
Author :
Publisher :
Page : 548 pages
File Size : 43,49 MB
Release : 1995
Category : Aeronautics
ISBN :