The Fingerprint


Book Description

The idea of The Fingerprint Sourcebook originated during a meeting in April 2002. Individuals representing the fingerprint, academic, and scientific communities met in Chicago, Illinois, for a day and a half to discuss the state of fingerprint identification with a view toward the challenges raised by Daubert issues. The meeting was a joint project between the International Association for Identification (IAI) and West Virginia University (WVU). One recommendation that came out of that meeting was a suggestion to create a sourcebook for friction ridge examiners, that is, a single source of researched information regarding the subject. This sourcebook would provide educational, training, and research information for the international scientific community.




Defects in Semiconductors


Book Description

This volume, number 91 in the Semiconductor and Semimetals series, focuses on defects in semiconductors. Defects in semiconductors help to explain several phenomena, from diffusion to getter, and to draw theories on materials' behavior in response to electrical or mechanical fields. The volume includes chapters focusing specifically on electron and proton irradiation of silicon, point defects in zinc oxide and gallium nitride, ion implantation defects and shallow junctions in silicon and germanium, and much more. It will help support students and scientists in their experimental and theoretical paths. - Expert contributors - Reviews of the most important recent literature - Clear illustrations - A broad view, including examination of defects in different semiconductors




Photovoltaic and Photoactive Materials


Book Description

The primary objective of this NATO Advanced Study Institute (ASI) was to present an up-to-date overview of various current areas of interest in the field of photovoltaic and related photoactive materials. This is a wide-ranging subject area, of significant commercial and environmental interest, and involves major contributions from the disciplines of physics, chemistry, materials, electrical and instrumentation engineering, commercial realisation etc. Therefore, we sought to adopt an inter disciplinary approach, bringing together recognised experts in the various fields while retaining a level of treatment accessible to those active in specific individual areas of research and development. The lecture programme commenced with overviews of the present relevance and historical development of the subject area, plus an introduction to various underlying physical principles of importance to the materials and devices to be addressed in later lectures. Building upon this, the ASI then progressed to more detailed aspects of the subject area. We were also fortunately able to obtain a contribution from Thierry Langlois d'Estaintot of the European Commission Directorate, describing present and future EC support for activities in this field. In addition, poster sessions were held throughout the meeting, to allow participants to present and discuss their current activities. These were supported by what proved to be very effective feedback sessions (special thanks to Martin Stutzmann), prior to which groups of participants enthusiastically met (often in the bar) to identify and agree topics of common interest.




Minerals as Advanced Materials II


Book Description

This book is a collection of papers that are devoted to various aspects of interactions between mineralogy and material sciences. It will include reviews, perspective papers and original research papers on mineral nanostructures, biomineralization, micro- and nanoporous mineral phases as functional materials, physical and optical properties of minerals, etc. Many important materials that dominate modern technological development were known to mineralogists for hundreds of years, though their properties were not fully recognized. Mineralogy, on the other hand, needs new impacts for the further development in the line of modern scientific achievements such as bio- and nanotechnologies as well as by the understanding of a deep role that information plays in the formation of natural structures and definition of natural processes. It is the idea of this series of books to provide an arena for interdisciplinary discussion on minerals as advanced materials.




Ultra-thin Chip Technology and Applications


Book Description

Ultra-thin chips are the "smart skin" of a conventional silicon chip. This book shows how very thin and flexible chips can be fabricated and used in many new applications in microelectronics, Microsystems, biomedical and other fields. It provides a comprehensive reference to the fabrication technology, post processing, characterization and the applications of ultra-thin chips.







Continuum Theory and Modeling of Thermoelectric Elements


Book Description

Sound knowledge of the latest research results in the thermodynamics and design of thermoelectric devices, providing a solid foundation for thermoelectric element and module design in the technical development process and thus serving as an indispensable tool for any application development. The text is aimed mainly at the project developer in the field of thermoelectric technology, both in academia and industry, as well as at graduate and advanced undergraduate students. Some core sections address the specialist in the field of thermoelectric energy conversion, providing detailed discussion of key points with regard to optimization. The international team of authors with experience in thermoelectrics research represents such institutes as EnsiCaen Universite de Paris, JPL, CalTech, and the German Aerospace Center.




X-Ray Metrology in Semiconductor Manufacturing


Book Description

The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved using x-rays. While many books are available on the theory behind x-ray metrology (XRM), X-Ray Metrology in Semiconductor Manufacturing is the first book to focus on the practical aspects of the technology and its application in device fabrication and solving new materials problems. Following a general overview of the field, the first section of the book is organized by application and outlines the techniques that are best suited to each. The next section delves into the techniques and theory behind the applications, such as specular x-ray reflectivity, diffraction imaging, and defect mapping. Finally, the third section provides technological details of each technique, answering questions commonly encountered in practice. The authors supply real examples from the semiconductor and magnetic recording industries as well as more than 150 clearly drawn figures to illustrate the discussion. They also summarize the principles and key information about each method with inset boxes found throughout the text. Written by world leaders in the field, X-Ray Metrology in Semiconductor Manufacturing provides real solutions with a focus on accuracy, repeatability, and throughput.




Interfacial Engineering for Optimized Properties: Volume 458


Book Description

The study of interfaces is one of the oldest areas of research in materials science. The presence of grain boundaries in materials has long been recognized, as has its crucial role in determining mechanical properties. Another long-recognized concept is that the properties of a surface are quite different from those of the bulk. In recent years, researchers have been able to study these interfaces, both internal and external, with a detail not before possible. These advances have stemmed from the ability to obtain atomic resolution images of interfaces, to measure accurate chemical compositions of interfaces, and to model these interfaces and their properties. This volume goes a step further, beyond structural and chemical studies, to explore how all of this information can be used to engineer interfaces for improved properties and overall improved material performance. Significant attention is given to the crystallographic nature of grain boundaries and interfaces, and the relationship between this nature and the performance of a material. The versatility of electron back-scattering pattern analysis (EBSP) in solving a number of interface-related problems is also featured.




Interfaces in High-Tc Superconducting Systems


Book Description

Because the new high-temperature superconductors cannot be grown as large single crystals, interfaces and junctions play an important role in their properties. The chapters in this book, each by leading researchers in the field, examine the state of our understanding of such interfaces. Chapters cover such topics as studies of YCBO films by transmission-electron, scanning-tunneling, and atomic-force microscopy; microstructure, interfacial interactions, and twin boundary structures in YCBO films; grain-boundary Josephson junctions; and overlayer formation.