Author : Bongjin Simon Mun
Publisher :
Page : 288 pages
File Size : 41,27 MB
Release : 2001
Category :
ISBN :
Author : Brian C. Sell
Publisher :
Page : 346 pages
File Size : 32,24 MB
Release : 2007
Category :
ISBN :
Author :
Publisher : ScholarlyEditions
Page : 2352 pages
File Size : 19,84 MB
Release : 2012-01-09
Category : Science
ISBN : 1464963851
Issues in Analysis, Measurement, Monitoring, Imaging, and Remote Sensing Technology: 2011 Edition is a ScholarlyEditions™ eBook that delivers timely, authoritative, and comprehensive information about Analysis, Measurement, Monitoring, Imaging, and Remote Sensing Technology. The editors have built Issues in Analysis, Measurement, Monitoring, Imaging, and Remote Sensing Technology: 2011 Edition on the vast information databases of ScholarlyNews.™ You can expect the information about Analysis, Measurement, Monitoring, Imaging, and Remote Sensing Technology in this eBook to be deeper than what you can access anywhere else, as well as consistently reliable, authoritative, informed, and relevant. The content of Issues in Analysis, Measurement, Monitoring, Imaging, and Remote Sensing Technology: 2011 Edition has been produced by the world’s leading scientists, engineers, analysts, research institutions, and companies. All of the content is from peer-reviewed sources, and all of it is written, assembled, and edited by the editors at ScholarlyEditions™ and available exclusively from us. You now have a source you can cite with authority, confidence, and credibility. More information is available at http://www.ScholarlyEditions.com/.
Author :
Publisher :
Page : 858 pages
File Size : 35,33 MB
Release : 2002
Category : Dissertations, Academic
ISBN :
Author : Joseph Woicik
Publisher : Springer
Page : 576 pages
File Size : 13,38 MB
Release : 2015-12-26
Category : Science
ISBN : 3319240439
This book provides the first complete and up-to-date summary of the state of the art in HAXPES and motivates readers to harness its powerful capabilities in their own research. The chapters are written by experts. They include historical work, modern instrumentation, theory and applications. This book spans from physics to chemistry and materials science and engineering. In consideration of the rapid development of the technique, several chapters include highlights illustrating future opportunities as well.
Author :
Publisher :
Page : 776 pages
File Size : 17,77 MB
Release : 2001
Category : Dissertation abstracts
ISBN :
Author : Claudia Cancellieri
Publisher : Springer
Page : 326 pages
File Size : 44,12 MB
Release : 2018-04-09
Category : Technology & Engineering
ISBN : 3319749897
This book summarizes the most recent and compelling experimental results for complex oxide interfaces. The results of this book were obtained with the cutting-edge photoemission technique at highest energy resolution. Due to their fascinating properties for new-generation electronic devices and the challenge of investigating buried regions, the book chiefly focuses on complex oxide interfaces. The crucial feature of exploring buried interfaces is the use of soft X-ray angle-resolved photoemission spectroscopy (ARPES) operating on the energy range of a few hundred eV to increase the photoelectron mean free path, enabling the photons to penetrate through the top layers – in contrast to conventional ultraviolet (UV)-ARPES techniques. The results presented here, achieved by different research groups around the world, are summarized in a clearly structured way and discussed in comparison with other photoemission spectroscopy techniques and other oxide materials. They are complemented and supported by the most recent theoretical calculations as well as results of complementary experimental techniques including electron transport and inelastic resonant X-ray scattering.
Author : Jorg Zegenhagen
Publisher : World Scientific
Page : 557 pages
File Size : 16,45 MB
Release : 2013-01-30
Category : Science
ISBN : 9814513105
The X-ray standing wave (XSW) technique is an X-ray interferometric method combining diffraction with a multitude of spectroscopic techniques. It is extremely powerful for obtaining information about virtually all properties of surfaces and interfaces on the atomic scale. However, as with any other technique, it has strengths and limitations. The proper use and necessary understanding of this method requires knowledge in quite different fields of physics and technology. This volume presents comprehensively the theoretical background, technical requirements and distinguished experimental highlights of the technique. Containing contributions from the most prominent experts of the technique, such as Andre Authier, Boris Batterman, Michael J Bedzyk, Jene Golovchenko, Victor Kohn, Michail Kovalchuk, Gerhard Materlik and D Phil Woodruff, the book equips scientists with all the necessary information and knowledge to understand and use the XSW technique in practically all applications.
Author : Harald Ibach
Publisher : Springer Science & Business Media
Page : 653 pages
File Size : 36,44 MB
Release : 2006-11-18
Category : Science
ISBN : 3540347100
This graduate-level textbook covers the major developments in surface sciences of recent decades, from experimental tricks and basic techniques to the latest experimental methods and theoretical understanding. It is unique in its attempt to treat the physics of surfaces, thin films and interfaces, surface chemistry, thermodynamics, statistical physics and the physics of the solid/electrolyte interface in an integral manner, rather than in separate compartments. It is designed as a handbook for the researcher as well as a study-text for graduate students. Written explanations are supported by 350 graphs and illustrations.
Author :
Publisher :
Page : 2664 pages
File Size : 24,73 MB
Release :
Category : Chemistry
ISBN :
