Proceedings of the 14th International Conference on Defects in Semiconductors
Author : H. J. von Bardeleben
Publisher :
Page : 494 pages
File Size : 42,36 MB
Release : 1986
Category : Semiconductors
ISBN :
Author : H. J. von Bardeleben
Publisher :
Page : 494 pages
File Size : 42,36 MB
Release : 1986
Category : Semiconductors
ISBN :
Author : Ping Jiang
Publisher : World Scientific
Page : 2151 pages
File Size : 32,50 MB
Release : 1993-03-31
Category :
ISBN : 9814554065
The 21st conference proceedings continue the tradition of the ICPS series. The proceedings cover all aspects of semiconductor physics, including those related to materials, processing and devices. Plenary and invited speakers address areas of major interest.
Author : G. R. Srinivasan
Publisher :
Page : 826 pages
File Size : 45,30 MB
Release : 1991
Category : Semiconductors
ISBN :
Author : Karl W. Böer
Publisher : Springer Nature
Page : 1408 pages
File Size : 26,40 MB
Release : 2023-02-02
Category : Technology & Engineering
ISBN : 3031182863
This handbook gives a complete and detailed survey of the field of semiconductor physics. It addresses every fundamental principle, the most important research topics and results, as well as conventional and emerging new areas of application. Additionally it provides all essential reference material on crystalline bulk, low-dimensional, and amorphous semiconductors, including valuable data on their optical, transport, and dynamic properties. This updated and extended second edition includes essential coverage of rapidly advancing areas in semiconductor physics, such as topological insulators, quantum optics, magnetic nanostructures and spintronic systems. Richly illustrated and authored by a duo of internationally acclaimed experts in solar energy and semiconductor physics, this handbook delivers in-depth treatment of the field, reflecting a combined experience spanning several decades as both researchers and educators. Offering a unique perspective on many issues, Semiconductor Physics is an invaluable reference for physicists, materials scientists and engineers throughout academia and industry.
Author : Alberto Pasquevich
Publisher : Springer Science & Business Media
Page : 648 pages
File Size : 45,79 MB
Release : 2010-04-08
Category : Science
ISBN : 3540853200
This volume of proceedings includes new and original scientific results along with recent developments in instrumentation and methods, in invited and contributed papers. Researchers and graduate students interested in hyperfine interaction detected by nuclear radiation as well as nuclear quadrupole interactions detected by resonance methods in the areas of materials, biological and medical science will find this volume indispensable.
Author : A.G. Cullis
Publisher : CRC Press
Page : 819 pages
File Size : 20,13 MB
Release : 2021-01-31
Category : Science
ISBN : 1000112209
The various forms of microscopy and related microanalytical techniques are making unique contributions to semiconductor research and development that underpin many important areas of microelectronics technology. Microscopy of Semiconducting Materials 1987 highlights the progress that is being made in semiconductor microscopy, primarily in electron probe methods as well as in light optical and ion scattering techniques. The book covers the state of the art, with sections on high resolution microscopy, epitaxial layers, quantum wells and superlattices, bulk gallium arsenide and other compounds, properties of dislocations, device silicon and dielectric structures, silicides and contacts, device testing, x-ray techniques, microanalysis, and advanced scanning microscopy techniques. Contributed by numerous international experts, this volume will be an indispensable guide to recent developments in semiconductor microscopy for all those who work in the field of semiconducting materials and research development.
Author : Victor I. Fistul
Publisher : CRC Press
Page : 448 pages
File Size : 37,28 MB
Release : 2004-01-27
Category : Science
ISBN : 0203299256
Although there is a good deal of research concerning semiconductor impurities available, most publications on the subject are very specialized and very theoretical. Until now, the field lacked a text that described the current experimental data, applications, and theory concerning impurities in semiconductor physics. Impurities in Semicondu
Author : Cullis
Publisher : CRC Press
Page : 836 pages
File Size : 10,5 MB
Release : 1987-10-01
Category : Technology & Engineering
ISBN : 9780854981786
The various forms of microscopy and related microanalytical techniques are making unique contributions to semiconductor research and development that underpin many important areas of microelectronics technology. Microscopy of Semiconducting Materials 1987 highlights the progress that is being made in semiconductor microscopy, primarily in electron probe methods as well as in light optical and ion scattering techniques. The book covers the state of the art, with sections on high resolution microscopy, epitaxial layers, quantum wells and superlattices, bulk gallium arsenide and other compounds, properties of dislocations, device silicon and dielectric structures, silicides and contacts, device testing, x-ray techniques, microanalysis, and advanced scanning microscopy techniques. Contributed by numerous international experts, this volume will be an indispensable guide to recent developments in semiconductor microscopy for all those who work in the field of semiconducting materials and research development.
Author :
Publisher :
Page : 664 pages
File Size : 46,39 MB
Release : 1987
Category : Infrared radiation
ISBN :
Author : H. J. von Bardeleben
Publisher :
Page : 706 pages
File Size : 43,20 MB
Release : 1986
Category : Science
ISBN :
Proceedings of the 14th International Conference on Defects in Semiconductors (ICDS-14), Paris, France, 1986