Progress in VLSI Design and Test


Book Description

This book constitutes the refereed proceedings of the 16th International Symposium on VSLI Design and Test, VDAT 2012, held in Shibpur, India, in July 2012. The 30 revised regular papers presented together with 10 short papers and 13 poster sessions were carefully selected from 135 submissions. The papers are organized in topical sections on VLSI design, design and modeling of digital circuits and systems, testing and verification, design for testability, testing memories and regular logic arrays, embedded systems: hardware/software co-design and verification, emerging technology: nanoscale computing and nanotechnology.




Progress in VLSI Design and Test, 2004


Book Description

Papers presented at the 8th VLSI Design and Test Workshop, held at Mysore in 2004.




Progress in VLSI Design and Test 2005


Book Description

Papers presented at the 9th VLSI Design and Test Symposium, held at Bangalore during 10-13 August 2005.




Progress in VLSI Design and Test, 2006


Book Description

Papers presented at the 10th VLSI Design and Test Symposium, held at Panaji during 9-12 August 2006.




Progress in VLSI Design and Test 2007


Book Description

Papers presented at the 11th VLSI Design and Test Symposium, held at Kolkata during 8-9 August 2007.




VLSI Design and Test


Book Description

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.




Progress in VLSI Design & Test


Book Description

Papers presented at the 12th VLSI Design and Test Symposium, held at Bangalore in 2008.




Progress in VLSI Design & Test


Book Description

Papers presented at the VLSI Design and Test Symposium, held at Bangalore during 8-10 July 2009.




Progress in Computing, Analytics and Networking


Book Description

The book focuses to foster new and original research ideas and results in three broad areas: computing, analytics, and networking with its prospective applications in the various interdisciplinary domains of engineering. This is an exciting and emerging interdisciplinary area in which a wide range of theory and methodologies are being investigated and developed to tackle complex and challenging real world problems. It also provides insights into the International Conference on Computing Analytics and Networking (ICCAN 2017) which is a premier international open forum for scientists, researchers and technocrats in academia as well as in industries from different parts of the world to present, interact, and exchange the state of art of concepts, prototypes, innovative research ideas in several diversified fields. The book includes invited keynote papers and paper presentations from both academia and industry to initiate and ignite our young minds in the meadow of momentous research and thereby enrich their existing knowledge. The book aims at postgraduate students and researchers working in the discipline of Computer Science & Engineering. It will be also useful for the researchers working in the domain of electronics as it contains some hardware technologies and forthcoming communication technologies.




Advanced VLSI Design and Testability Issues


Book Description

This book facilitates the VLSI-interested individuals with not only in-depth knowledge, but also the broad aspects of it by explaining its applications in different fields, including image processing and biomedical. The deep understanding of basic concepts gives you the power to develop a new application aspect, which is very well taken care of in this book by using simple language in explaining the concepts. In the VLSI world, the importance of hardware description languages cannot be ignored, as the designing of such dense and complex circuits is not possible without them. Both Verilog and VHDL languages are used here for designing. The current needs of high-performance integrated circuits (ICs) including low power devices and new emerging materials, which can play a very important role in achieving new functionalities, are the most interesting part of the book. The testing of VLSI circuits becomes more crucial than the designing of the circuits in this nanometer technology era. The role of fault simulation algorithms is very well explained, and its implementation using Verilog is the key aspect of this book. This book is well organized into 20 chapters. Chapter 1 emphasizes on uses of FPGA on various image processing and biomedical applications. Then, the descriptions enlighten the basic understanding of digital design from the perspective of HDL in Chapters 2–5. The performance enhancement with alternate material or geometry for silicon-based FET designs is focused in Chapters 6 and 7. Chapters 8 and 9 describe the study of bimolecular interactions with biosensing FETs. Chapters 10–13 deal with advanced FET structures available in various shapes, materials such as nanowire, HFET, and their comparison in terms of device performance metrics calculation. Chapters 14–18 describe different application-specific VLSI design techniques and challenges for analog and digital circuit designs. Chapter 19 explains the VLSI testability issues with the description of simulation and its categorization into logic and fault simulation for test pattern generation using Verilog HDL. Chapter 20 deals with a secured VLSI design with hardware obfuscation by hiding the IC’s structure and function, which makes it much more difficult to reverse engineer.