Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization


Book Description

This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.




Concise Encyclopedia of Materials Characterization


Book Description

To use materials effectively, their composition, degree of perfection, physical and mechanical characteristics, and microstructure must be accurately determined. This concise encyclopledia covers the wide range of characterization techniques necessary to achieve this. Articles included are not only concerned with the characterization techniques of specific materials such as polymers, metals, ceramics and semiconductors but also techniques which can be applied to materials in general. The techniques described cover bulk methods, and also a number of specific methods to study the topography and composition of surface and near-surface regions. These techniques range from the well-established and traditional to the very latest including: atomic force microscopy; confocal optical microscopy; gamma ray diffractometry; thermal wave imaging; x-ray diffraction and time-resolved techniques. This unique concise encyclopedia comprises 116 articles by leading experts in the field from around the world to create the ideal guide for materials scientists, chemists and engineers involved with any aspect of materials characterization. With over 540 illustrations, extensive cross-referencing, approximately 900 references, and a detailed index, this concise encyclopedia will be a valuable asset to any materials science collection.




Stimulated Raman Scattering Microscopy


Book Description

Stimulated Raman Scattering Microscopy: Techniques and Applications describes innovations in instrumentation, data science, chemical probe development, and various applications enabled by a state-of-the-art stimulated Raman scattering (SRS) microscope. Beginning by introducing the history of SRS, this book is composed of seven parts in depth including instrumentation strategies that have pushed the physical limits of SRS microscopy, vibrational probes (which increased the SRS imaging functionality), data science methods, and recent efforts in miniaturization. This rapidly growing field needs a comprehensive resource that brings together the current knowledge on the topic, and this book does just that. Researchers who need to know the requirements for all aspects of the instrumentation as well as the requirements of different imaging applications (such as different types of biological tissue) will benefit enormously from the examples of successful demonstrations of SRS imaging in the book. Led by Editor-in-Chief Ji-Xin Cheng, a pioneer in coherent Raman scattering microscopy, the editorial team has brought together various experts on each aspect of SRS imaging from around the world to provide an authoritative guide to this increasingly important imaging technique. This book is a comprehensive reference for researchers, faculty, postdoctoral researchers, and engineers. - Includes every aspect from theoretic reviews of SRS spectroscopy to innovations in instrumentation and current applications of SRS microscopy - Provides copious visual elements that illustrate key information, such as SRS images of various biological samples and instrument diagrams and schematics - Edited by leading experts of SRS microscopy, with each chapter written by experts in their given topics




Engineered Ferrites and Their Applications


Book Description

This book edited by leading experts focuses on the foundation of ferrite materials since inception to its contemporary scenario including their vast applications. The contents range from the basic physics and chemistry of ferrites to its applications in telecommunication, SAR reduction, EMI shielding, hyperthermia treatment, and water decontamination. It also focuses on ferrite nanoparticles for sensing application, energy-storage applications, antimicrobial applications, corrosion protection applications, among others. This book is a useful reference to those in academia and industry.




Non-Destructive Material Characterization Methods


Book Description

Non-Destructive Material Characterization Methods provides readers with a trove of theoretical and practical insight into how to implement different non-destructive testing methods for effective material characterization. The book starts with an introduction to the field before moving right into a discussion of a wide range of techniques that can be immediately implemented. Various imaging and microscopy techniques are first covered, with step-by-step insights on characterization using a polarized microscope, an atomic force microscope, computed tomography, ultrasonography, magnetic resonance imaging, infrared tomography, and more. Each chapter includes case studies, applications, and recent developments. From there, elemental assay and mapping techniques are discussed, including Raman spectroscopy, UV spectroscopy, atomic absorption spectroscopy, neutron activation analysis, and various others. The book concludes with sections covering displacement measurement techniques, large-scale facility techniques, and methods involving multiscale analysis and advanced analysis. - Provides an overview of a wide-range of NDT material characterization methods, strengths and weaknesses of these methods, when to apply them, and more - Includes eddy current sensing and imaging, ultrasonic sensing and imaging, RF and THz imaging, internet and cloud-based methods, among many others - Presents case studies, applications and other insights on putting these methods into practice




Material Characterization Techniques and Applications


Book Description

This book presents commonly applied characterization techniques in material science, their brief history and origins, mechanism of operation, advantages and disadvantages, their biosensing applications, and troubleshooting for each technique, while addressing the challenges researchers face when working with these techniques. The book dedicates its focus to identifying physicochemical and electrochemical nature of materials including analyses of morphology, mass spectrometry, and topography, as well as the characterization of elemental, structural, thermal, wettability, electrochemical, and chromatography properties. Additionally, the main features and benefits of using coupled characterization techniques are discussed in this book.




Construction Materials and Structures


Book Description

The two volumes of these Proceedings contain about 200 conference papers and 10 keynote papers presented at the First International Conference on Construction Materials and Structures, held in Johannesburg, South Africa from 24 to 26 November 2014. It includes sections on Materials and characterization; Durability of construction materials; Structural implications, performance, service life; Sustainability, waste utilization, the environment; and Building science and construction.




Advanced Nanomaterials and Their Applications in Renewable Energy


Book Description

Advanced Nanomaterials and Their Applications in Renewable Energy presents timely topics related to nanomaterials' feasible synthesis and characterization, and their application in the energy fields. In addition, the book provides insights and scientific discoveries in toxicity study, with information that is easily understood by a wide audience. Advanced energy materials are important in designing materials that have greater physical, electronic, and optical properties. This book emphasizes the fundamental physics and chemistry underlying the techniques used to develop solar and fuel cells with high charge densities and energy conversion efficiencies. New analytical techniques (synchronous X-ray) which probe the interactions of particles and radiation with matter are also explored, making this book an invaluable reference for practitioners and those interested in the science. - Provides a comprehensive review of solar energy, fuel cells, and gas storage from 2010 to the present - Reviews feasible synthesis and modern analytical techniques used in alternative energy - Explores examples of research in alternative energy, including current assessments of nanomaterials and safety - Contains a glossary of terms, units, and historical benchmarks - Presents a useful guide that will bring readers up to speed on historical developments in alternative fuel cells




Fundamentals and Application of Atomic Force Microscopy for Food Research


Book Description

Fundamentals and Application of Atomic Force Microscopy for Food Research explains how to get reliable AFM data and current application progress of AFM in different food substances. Sections focus on an Introduction to AFM for food research and Applications of AFM for different types of food substances. Edited by 3 experts in the field of nanotechnology and food science, this book reduces the difficulty of AFM application and shortens the learning time for new hands. Until now, no such book has systematically described the application of Atomic Force Microscopy (AFM) for food research. Many scientists in the field of food science and engineering need to evaluate their developed foods and food contact surfaces at nanoscale. However, there is a steep learning curve for new hands, hence the need for this comprehensive resource. - Describes the application of AFM for food research - Covers applications of AFM for different types of food substances - Addresses future uses and perspectives of AFM for the development of food nanotechnology




Semiconductor Strain Metrology


Book Description

This book surveys the major and newly developed techniques for semiconductor strain metrology. Semiconductor strain metrology has emerged in recent years as a topic of great interest to researchers involved in thin film and nanoscale device characterizati