Reference Intensity Method of Quantitative X-ray Diffraction Analysis
Author : Briant L. Davis
Publisher :
Page : 228 pages
File Size : 13,67 MB
Release : 1988
Category : X-rays
ISBN :
Author : Briant L. Davis
Publisher :
Page : 228 pages
File Size : 13,67 MB
Release : 1988
Category : X-rays
ISBN :
Author : Briant L. Davis
Publisher :
Page : 213 pages
File Size : 31,60 MB
Release :
Category : X-rays
ISBN :
Author : David L. Bish
Publisher : Walter de Gruyter GmbH & Co KG
Page : 384 pages
File Size : 33,11 MB
Release : 2018-12-17
Category : Science
ISBN : 1501509012
Volume 20 of Reviews in Mineralogy attempted to: (1) provide examples illustrating the state-of-the-art in powder diffraction, with emphasis on applications to geological materials; (2) describe how to obtain high-quality powder diffraction data; and (3) show how to extract maximum information from available data. In particular, the nonambient experiments are examples of some of the new and exciting areas of study using powder diffraction, and the interested reader is directed to the rapidly growing number of published papers on these subjects. Powder diffraction has evolved to a point where considerable information can be obtained from ug-sized samples, where detection limits are in the hundreds of ppm range, and where useful data can be obtained in milliseconds to microseconds. We hope that the information in this volume will increase the reader's access to the considerable amount of information contained in typical diffraction data.
Author :
Publisher : DIANE Publishing
Page : 18 pages
File Size : 42,90 MB
Release : 1995
Category :
ISBN : 9781422318324
Author : James W. Ballard
Publisher :
Page : 24 pages
File Size : 26,53 MB
Release : 1946
Category : Analytical chemistry
ISBN :
Author : Lev S. Zevin
Publisher : Springer Science & Business Media
Page : 389 pages
File Size : 14,35 MB
Release : 2012-12-06
Category : Science
ISBN : 1461395356
One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be measured, not its phase. The inverse problem, of determining the structure from the pattern thus contains ambiguities that must be resolved by other means. Quantitative X-ray analysis provides one way to resolve this phase problem: mixing the material in question with a material of known structure yields interferences that can be analyzed to yield the unknown phases. Invented in 1916, but little used at the time, the technique has seen a recent revival due to the development of extremely precise X-ray diffractometers coupled with powerful computers.
Author : Paul E. Stutzman
Publisher :
Page : 28 pages
File Size : 12,58 MB
Release : 2015
Category : Cement
ISBN :
X-ray powder diffraction analysis is used in the cement industry as a direct analytical method for phase identification and quantitative analysis of clinker and cements. Quantitative methods initially relied on the development of calibration curves, employing multiple reference mixtures of cement phases with an internal standard to develop a plot of diffraction peak intensity ratios vs. mass fraction ratios. Obstacles to this approach were the availability of reference standards that adequately replicated those phases in the clinker or cement, and the ability to accurately measure diffraction peak intensities because of severe peak overlap. The Rietveld method for analysis of powder diffraction data addresses both of these difficulties through use of refineable crystal structure models to calculate the individual phase diffraction patterns and a whole-pattern fitting procedure to minimize the difference between the measured diffraction pattern and set of calculated phase patterns. This approach has revolutionized the application of X-ray powder diffraction in many scientific disciplines, including that of hydraulic cements, but can be a complicated method to learn. This tutorial is intended to provide an introduction to the application of Rietveld analysis to portland cement clinker and cements using examples developed from one of the NIST SRM clinkers and two portland cements.
Author : Yoshio Waseda
Publisher : Springer Science & Business Media
Page : 320 pages
File Size : 25,4 MB
Release : 2011-03-18
Category : Technology & Engineering
ISBN : 3642166350
X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.
Author : Peter Brouwer
Publisher :
Page : 71 pages
File Size : 35,6 MB
Release : 2006
Category :
ISBN : 9789090167589
Author : Frank Smith
Publisher : CRC Press
Page : 1024 pages
File Size : 47,95 MB
Release : 1999-09-22
Category : Science
ISBN : 1482276119
By illustrating a wide range of specific applications in all major industries, this work broadens the coverage of X-ray diffraction beyond basic tenets, research and academic principles. The book serves as a guide to solving problems faced everyday in the laboratory, and offers a review of the current theory and practice of X-ray diffraction, major