Reliability, Testing, and Characterization of MEMS/MOEMS
Author :
Publisher :
Page : 0 pages
File Size : 10,46 MB
Release : 2004
Category : Microelectromechanical systems
ISBN :
Reliability, Testing, and Characterization of MEMS/MOEMS
Author : Rajeshuni Ramesham
Publisher : Society of Photo Optical
Page : 296 pages
File Size : 41,39 MB
Release : 2001
Category : Technology & Engineering
ISBN : 9780819442864
Book Description
Reliability, Testing, and Characterization of MEMS/MOEMS II
Author : Rajeshuni Ramesham
Publisher : Society of Photo Optical
Page : 334 pages
File Size : 23,68 MB
Release : 2003
Category : Technology & Engineering
ISBN : 9780819447807
Book Description
Reliability, Testing, and Characterization of MEMS/MOEMS III
Author : Danelle Mary Tanner
Publisher : SPIE-International Society for Optical Engineering
Page : 0 pages
File Size : 35,84 MB
Release : 2004
Category : Technology & Engineering
ISBN : 9780819452511
Book Description
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Reliability, Testing, and Characterization of MEMS/MOEMS.
Author :
Publisher :
Page : 332 pages
File Size : 22,53 MB
Release : 2001
Category : Microelectromechanical systems
ISBN :
Book Description
MEMS Reliability
Author : Allyson L. Hartzell
Publisher : Springer Science & Business Media
Page : 300 pages
File Size : 50,44 MB
Release : 2010-11-02
Category : Technology & Engineering
ISBN : 144196018X
Book Description
The successful launch of viable MEMs product hinges on MEMS reliability, the reliability and qualification for MEMs based products is not widely understood. Companies that have a deep understanding of MEMs reliability view the information as a competitive advantage and are reluctant to share it. MEMs Reliability, focuses on the reliability and manufacturability of MEMS at a fundamental level by addressing process development and characterization, material property characterization, failure mechanisms and physics of failure (POF), design strategies for improving yield, design for reliability (DFR), packaging and testing.
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV
Author : Danelle Mary Tanner
Publisher : SPIE-International Society for Optical Engineering
Page : 272 pages
File Size : 30,57 MB
Release : 2005
Category : Technology & Engineering
ISBN : 9780819456908
Book Description
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X
Author : Sonia Garcia-Blanco
Publisher : SPIE-International Society for Optical Engineering
Page : 256 pages
File Size : 35,92 MB
Release : 2011
Category : Microelectromechanical systems
ISBN : 9780819484659
Book Description
Includes Proceedings Vol. 7821
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V
Author :
Publisher :
Page : pages
File Size : 46,93 MB
Release : 2006
Category : Microelectromechanical systems
ISBN :
Book Description
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX
Author : Richard C. Kullberg
Publisher : SPIE-International Society for Optical Engineering
Page : 344 pages
File Size : 23,48 MB
Release : 2010
Category : Microelectromechanical systems
ISBN : 9780819479884
Book Description
Includes Proceedings Vol. 7821
