Author : Douglas C. Hansen
Publisher : The Electrochemical Society
Page : 224 pages
File Size : 23,91 MB
Release : 2001
Category : Science
ISBN : 9781566773027
Author : Alexander Ziegler
Publisher : Springer Science & Business Media
Page : 265 pages
File Size : 23,78 MB
Release : 2014-04-01
Category : Science
ISBN : 3642451527
The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical and x-ray microscopies (e.g. scanning, transmission and low-energy electron microscopy and scanning probe microscopy) or in the scattering realm with x-ray, neutron and electron diffraction.
Author : Osvaldo de Oliveira Jr
Publisher : William Andrew
Page : 224 pages
File Size : 41,20 MB
Release : 2017-03-18
Category : Technology & Engineering
ISBN : 0323497799
Nanocharacterization Techniques covers the main characterization techniques used in nanomaterials and nanostructures. The chapters focus on the fundamental aspects of characterization techniques and their distinctive approaches. Significant advances that have taken place over recent years in refining techniques are covered, and the mathematical foundations needed to use the techniques are also explained in detail. This book is an important reference for materials scientists and engineers looking for a through analysis of nanocharacterization techniques in order to establish which is best for their needs. - Includes a detailed analysis of different nanocharacterization techniques, allowing readers to explore which one is best for their particular needs - Provides examples of how each characterization technique has been used, giving readers a greater understanding of how each technique can be profitably used - Covers the mathematical background needed to utilize each of these techniques to their best effect, meaning that readers can gain a full understanding of the theoretical principles behind each technique covered - Serves as an important, go-to reference for materials scientists and engineers
Author : Weilie Zhou
Publisher : Springer Science & Business Media
Page : 533 pages
File Size : 32,20 MB
Release : 2007-03-09
Category : Technology & Engineering
ISBN : 0387396209
This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.
Author : Roland Wiesendanger
Publisher : Cambridge University Press
Page : 664 pages
File Size : 20,10 MB
Release : 1994-09-29
Category : Science
ISBN : 9780521428477
The investigation and manipulation of matter on the atomic scale have been revolutionised by scanning tunnelling microscopy and related scanning probe techniques. This book is the first to provide a clear and comprehensive introduction to this subject. Beginning with the theoretical background of scanning tunnelling microscopy, the design and instrumentation of practical STM and associated systems are described in detail, as are the applications of these techniques in fields such as condensed matter physics, chemistry, biology, and nanotechnology. Containing 350 illustrations, and over 1200 references, this unique book represents an ideal introduction to the subject for final-year undergraduates in physics or materials science. It will also be invaluable to graduate students and researchers in any branch of science where scanning probe techniques are used.
Author : Redouane Borsali
Publisher : Springer Science & Business Media
Page : 1490 pages
File Size : 21,79 MB
Release : 2008-07-28
Category : Science
ISBN : 140204464X
This 2-volume set includes extensive discussions of scattering techniques (light, neutron and X-ray) and related fluctuation and grating techniques that are at the forefront of this field. Most of the scattering techniques are Fourier space techniques. Recent advances have seen the development of powerful direct imaging methods such as atomic force microscopy and scanning probe microscopy. In addition, techniques that can be used to manipulate soft matter on the nanometer scale are also in rapid development. These include the scanning probe microscopy technique mentioned above as well as optical and magnetic tweezers.
Author : Simonpietro Agnello
Publisher : John Wiley & Sons
Page : 500 pages
File Size : 19,28 MB
Release : 2021-09-08
Category : Technology & Engineering
ISBN : 1119697328
SPECTROSCOPY FOR MATERIALS CHARACTERIZATION Learn foundational and advanced spectroscopy techniques from leading researchers in physics, chemistry, surface science, and nanoscience In Spectroscopy for Materials Characterization, accomplished researcher Simonpietro Agnello delivers a practical and accessible compilation of various spectroscopy techniques taught and used to today. The book offers a wide-ranging approach taught by leading researchers working in physics, chemistry, surface science, and nanoscience. It is ideal for both new students and advanced researchers studying and working with spectroscopy. Topics such as confocal and two photon spectroscopy, as well as infrared absorption and Raman and micro-Raman spectroscopy, are discussed, as are thermally stimulated luminescence and spectroscopic studies of radiation effects on optical materials. Each chapter includes a basic introduction to the theory necessary to understand a specific technique, details about the characteristic instrumental features and apparatuses used, including tips for the appropriate arrangement of a typical experiment, and a reproducible case study that shows the discussed techniques used in a real laboratory. Readers will benefit from the inclusion of: Complete and practical case studies at the conclusion of each chapter to highlight the concepts and techniques discussed in the material Citations of additional resources ideal for further study A thorough introduction to the basic aspects of radiation matter interaction in the visible-ultraviolet range and the fundamentals of absorption and emission A rigorous exploration of time resolved spectroscopy at the nanosecond and femtosecond intervals Perfect for Master and Ph.D. students and researchers in physics, chemistry, engineering, and biology, Spectroscopy for Materials Characterization will also earn a place in the libraries of materials science researchers and students seeking a one-stop reference to basic and advanced spectroscopy techniques.
Author : D Williams
Publisher : CRC Press
Page : 546 pages
File Size : 41,16 MB
Release : 2000-01-01
Category : Science
ISBN : 9780750306850
Microbeam Analysis provides a major forum for the discussion of the latest microanalysis techniques using electron, ion, and photon beams. The volume contains 250 papers from the leading researchers in this advancing field. Researchers in physics, materials science, and electrical and electronic engineering will find useful information in this volume.
Author : Stephen J. Fonash
Publisher : John Wiley & Sons
Page : 307 pages
File Size : 24,60 MB
Release : 2018-12-03
Category : Technology & Engineering
ISBN : 3527338721
Das führende Lehrbuch der Nanotechnologie und ein Kompendium von Lehrveranstaltungen der Penn State University: didaktisch fundiert mit Lernzielen am Beginn der Kapitel, Kapitelzusammenfassungen und Literaturhinweisen.
Author : Howard R. Huff
Publisher : The Electrochemical Society
Page : 650 pages
File Size : 37,36 MB
Release : 2002
Category : Science
ISBN : 9781566773744
