Book Description
Contents of this volume include: on-line glossmeter for stainless steel sheets; in process optical measurement of micro profile on cold rolled steel plates; optical profile transducer; and optical profilers for surface roughness.
Author : Paolo G. Cielo
Publisher : SPIE-International Society for Optical Engineering
Page : 746 pages
File Size : 11,30 MB
Release : 1997
Category : Business & Economics
ISBN :
Contents of this volume include: on-line glossmeter for stainless steel sheets; in process optical measurement of micro profile on cold rolled steel plates; optical profile transducer; and optical profilers for surface roughness.
Author : Bruce G. Batchelor
Publisher :
Page : 668 pages
File Size : 22,22 MB
Release : 1994
Category : Computer vision
ISBN :
SPIE Milestones are collections of seminal papers from the world literature covering important discoveries and developments in optics and photonics.
Author : Francis T. S. Yu
Publisher : SPIE-International Society for Optical Engineering
Page : 668 pages
File Size : 27,85 MB
Release : 1999
Category : Computers
ISBN :
SPIE Milestones are collections of seminal papers from the world literature covering important discoveries and developments in optics and photonics.
Author : Paolo G. Cielo
Publisher :
Page : 632 pages
File Size : 15,6 MB
Release : 1988
Category : Science
ISBN :
This book presents an extensive review of the optical- and laser-based techniques that are available for quality control and process monitoring in the industrial production environment. The physical principles of each technique are explained in simple terms, and their applicability to specific industrial needs is discussed on the basis of wide hands-on experience. A large number of practical applications to in-process industrial sensing and metrology are described, and more than onethousand references are included. Topics include on-line surface inspection, 3-D imaging, nondestructive testing, fiber-optic sensors, robot guidance, as well as spectroscopic and light-scattering process analyzers. Key Features * Describes a large number of practical applications to in-process industrial sensing and metrology * Includes more than one thousand references * Covers on-line surface inspection, 3-D imaging, nondestructive testing, fiber-optic sensors, robot guidance, and more
Author : Mohammad S. Alam
Publisher : SPIE-International Society for Optical Engineering
Page : 672 pages
File Size : 45,80 MB
Release : 1999
Category : Computers
ISBN :
SPIE Milestones are collections of seminal papers from the world literature covering important discoveries and developments in optics and photonics.
Author : Olaf Minet
Publisher : SPIE-International Society for Optical Engineering
Page : 746 pages
File Size : 23,72 MB
Release : 1998
Category : Medical
ISBN :
SPIE Milestones are collections of seminal papers from the world literature covering important discoveries and developments in optics and photonics.
Author : Victor M. Bright
Publisher : SPIE-International Society for Optical Engineering
Page : 654 pages
File Size : 42,24 MB
Release : 1999
Category : Microelectromechanical systems
ISBN :
A selection of 81 papers on six major topics within the field of optical microelectromechanical systems (MEMS).
Author :
Publisher : Academic Press
Page : 479 pages
File Size : 29,38 MB
Release : 2009-11-18
Category : Science
ISBN : 0123785650
This book describes the practice of radiation thermometry, both at a primary level and for a variety of applications, such as in the materials processing industries and remote sensing. This book is written for those who will a) apply radiation thermometry in industrial practice b) use radiation thermometers for scientific research, c) the radiation thermometry specialist in a national measurement institute d) developers of radiation thermometers who are working to innovate products for instrument manufacturers and e) developers non-contact thermometry methods to address challenging thermometry problems. The author(s) of each chapter were chosen from a group of international scientists who are experts in the field and specialist(s) on the subject matter covered in the chapter. A large number of references are included at the end of each chapter as a resource for those seeking a deeper or more detailed understanding. This book is more than a practice guide. Readers will gain in-depth knowledge in: (1) the proper selection of the type of thermometer; (2) the best practice in using the radiation thermometers; (3) awareness of the error sources and subsequent appropriate procedure to reduce the overall uncertainty; and (4) understanding of the calibration chain and its current limitations. - Coverage of all fundamental aspects of the radiometric measurements - Coverage of practical applications with details on the instrumentation, calibration, and error sources - Authors are from the national labs internationally leading in R&D in temperature measurements - Comprehensive coverage with large number of references
Author : David J. Whitehouse
Publisher : SPIE-International Society for Optical Engineering
Page : 672 pages
File Size : 45,69 MB
Release : 1996
Category : Technology & Engineering
ISBN :
Topics in this volume include: comparison of interferometric contouring techniques; comparison of visibility of standard scratches; and near-grazing illumination and shadowing of rough surfaces.
Author : Sing H. Lee
Publisher : SPIE-International Society for Optical Engineering
Page : 744 pages
File Size : 16,16 MB
Release : 1997
Category : Computers
ISBN :
SPIE Milestones are collections of seminal papers from the world literature covering important discoveries and developments in optics and photonics.