Semiconductor Thermal Measurement and Management Symposium, 2010. SEMI-THERM 2010. 26th Annual IEEE.
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Page : pages
File Size : 15,45 MB
Release : 2010
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Page : pages
File Size : 15,45 MB
Release : 2010
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Page : 310 pages
File Size : 30,6 MB
Release : 2010
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ISBN : 9781424464579
Author : Alhussein Albarbar
Publisher : Springer
Page : 224 pages
File Size : 19,94 MB
Release : 2017-07-19
Category : Technology & Engineering
ISBN : 3319598287
This book analyzes the thermal characteristics of power electronic devices (PEDs) with a focus on those used in wind and solar energy systems. The authors focus on the devices used in such applications, for example boost converters and inverters under different operating conditions. The book explains in detail finite element modeling techniques, setting up measuring systems, data analysis, and PEDs’ lifetime calculations. It is appropriate reading for graduate students and researchers who focus on the design and reliability of power electronic devices.
Author : Marta Rencz
Publisher : Springer Nature
Page : 389 pages
File Size : 17,15 MB
Release : 2023-01-23
Category : Technology & Engineering
ISBN : 3030861740
This book discusses the significant aspects of thermal transient testing, the most important method of thermal characterization of electronics available today. The book presents the theoretical background of creating structure functions from the measured results with mathematical details. It then shows how the method can be used for thermal qualification, structure integrity testing, determining material parameters, and calibrating simulation models. General practical questions about measurements are discussed to help beginners carry out thermal transient testing. The particular problems and tricks of measuring with various electronic components, such as Si diodes, bipolar transistors, MOS transistors, IGBT devices, resistors, capacitors, wide bandgap materials, and LEDs, are covered in detail with the help of various use cases. This hands-on book will enable readers to accomplish thermal transient testing on any new type of electronics and provides the theoretical details needed to understand the opportunities and limitations offered by the methodology. The book will be an invaluable reference for practicing engineers, students, and researchers.
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Page : pages
File Size : 24,3 MB
Release : 2016
Category : Semiconductors
ISBN : 9781509023363
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Page : 251 pages
File Size : 14,35 MB
Release : 2014
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ISBN : 9781479943746
Author : ETCMOS
Publisher : CMOS Emerging Technologies Research
Page : 545 pages
File Size : 38,25 MB
Release : 2016-05-26
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ISBN : 1927500729
Presentation slides from the Devices, Circuits and Systems track at the ETCMOS 2016 conference in Montreal, May 25-27, 2016
Author : Jutta Kühn
Publisher : KIT Scientific Publishing
Page : 264 pages
File Size : 30,30 MB
Release : 2011
Category : Power amplifiers
ISBN : 3866446152
This work has arisen out of the strong demand for a superior power-added efficiency (PAE) of AlGaN/GaN high electron mobility transistor (HEMT) high-power amplifiers (HPAs) that are part of any advanced wireless multifunctional RF-system with limited prime energy. Different concepts and approaches on device and design level for PAE improvements are analyzed, e.g. structural and layout changes of the GaN transistor and advanced circuit design techniques for PAE improvements of GaN HEMT HPAs.
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File Size : 36,65 MB
Release : 2007
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Author : Weiqiang Liu
Publisher : Springer Nature
Page : 607 pages
File Size : 26,59 MB
Release : 2022-08-22
Category : Technology & Engineering
ISBN : 3030983471
This book explores the technological developments at various levels of abstraction, of the new paradigm of approximate computing. The authors describe in a single-source the state-of-the-art, covering the entire spectrum of research activities in approximate computing, bridging device, circuit, architecture, and system levels. Content includes tutorials, reviews and surveys of current theoretical/experimental results, design methodologies and applications developed in approximate computing for a wide scope of readership and specialists. Serves as a single-source reference to state-of-the-art of approximate computing; Covers broad range of topics, from circuits to applications; Includes contributions by leading researchers, from academia and industry.