16th IEEE VLSI Test Symposium
Author :
Publisher :
Page : 520 pages
File Size : 10,18 MB
Release : 1998
Category : Application-specific integrated circuits
ISBN : 9780818684364
Author :
Publisher :
Page : 520 pages
File Size : 10,18 MB
Release : 1998
Category : Application-specific integrated circuits
ISBN : 9780818684364
Author :
Publisher :
Page : 498 pages
File Size : 37,68 MB
Release : 2005
Category : Application-specific integrated circuits
ISBN :
Author :
Publisher :
Page : 802 pages
File Size : 24,30 MB
Release : 2000
Category : Evolutionary computation
ISBN :
Author : Julian Miller
Publisher : Springer Science & Business Media
Page : 296 pages
File Size : 37,13 MB
Release : 2000-03-29
Category : Computers
ISBN : 3540673385
This book constitutes the refereed proceedings of the Third International Conference on Evolvable Systems: From Biology to Hardware, ICES 2000, held in Edinburgh, Scotland, UK, in April 2000. The 27 revised full papers presented were carefully reviewed and selected for inclusion in the proceedings. Among the topics covered are evaluation of digital systems, evolution of analog systems, embryonic electronics, bio-inspired systems, artificial neural networks, adaptive robotics, adaptive hardware platforms, molecular computing, reconfigurable systems, immune systems, and self-repair.
Author : Julian F. Miller
Publisher : Springer
Page : 296 pages
File Size : 40,84 MB
Release : 2003-06-29
Category : Computers
ISBN : 3540464069
This book constitutes the refereed proceedings of the Third International Conference on Evolvable Systems: From Biology to Hardware, ICES 2000, held in Edinburgh, Scotland, UK, in April 2000. The 27 revised full papers presented were carefully reviewed and selected for inclusion in the proceedings. Among the topics covered are evaluation of digital systems, evolution of analog systems, embryonic electronics, bio-inspired systems, artificial neural networks, adaptive robotics, adaptive hardware platforms, molecular computing, reconfigurable systems, immune systems, and self-repair.
Author : British Library. Document Supply Centre
Publisher :
Page : 890 pages
File Size : 20,42 MB
Release : 1998
Category : Conference proceedings
ISBN :
Author :
Publisher :
Page : 550 pages
File Size : 49,32 MB
Release : 2003
Category : Electronic circuits
ISBN :
Author : Robert Aitken
Publisher :
Page : 524 pages
File Size : 20,51 MB
Release : 2004
Category : Technology & Engineering
ISBN : 9780769522418
DFT 2004 showcases the latest research results in the in the field of defect and fault tolerance in VLSI systems. Its papers cover yield, defect and fault tolerance, error correction, and circuit/system reliability and dependability.
Author : M. Bushnell
Publisher : Springer Science & Business Media
Page : 690 pages
File Size : 42,44 MB
Release : 2006-04-11
Category : Technology & Engineering
ISBN : 0306470403
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Author : Michael Nicolaidis
Publisher : Springer Science & Business Media
Page : 166 pages
File Size : 32,36 MB
Release : 1998-04-30
Category : Computers
ISBN : 9780792381327
Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.