Spreading Resistance Analysis for Silicon Layers with Nonuniform Resistivity
Author : David H. Dickey
Publisher :
Page : 76 pages
File Size : 36,69 MB
Release : 1979
Category : Semiconductors
ISBN :
Spreading Resistance Analysis for Silicon Layers with Nonuniform Resistivity
Author : David H. Dickey
Publisher :
Page : 76 pages
File Size : 47,78 MB
Release : 1979
Category : Electric resistance, Spreading
ISBN :
Book Description
NBS Special Publication
Author :
Publisher :
Page : 88 pages
File Size : 42,85 MB
Release : 1978
Category : Weights and measures
ISBN :
Book Description
Semiconductor Measurement Technology
Author : National Institute of Standards and Technology (U.S.)
Publisher :
Page : 60 pages
File Size : 46,1 MB
Release : 1993
Category : Semiconductors
ISBN :
Book Description
Emerging Semiconductor Technology
Author : Dinesh C. Gupta
Publisher : ASTM International
Page : 701 pages
File Size : 18,62 MB
Release : 1987
Category : Process control
ISBN : 0803104596
Book Description
National Semiconductor Metrology Program
Author : National Institute of Standards and Technology (U.S.)
Publisher :
Page : 160 pages
File Size : 32,13 MB
Release : 2000
Category : Semiconductors
ISBN :
Book Description
Semiconductor Measurement Technology
Author : United States. National Bureau of Standards
Publisher :
Page : 48 pages
File Size : 47,73 MB
Release : 1979
Category : Integrated circuits
ISBN :
Book Description
Monthly Catalog of United States Government Publications
Author : United States. Superintendent of Documents
Publisher :
Page : 1250 pages
File Size : 45,14 MB
Release : 1979
Category : Government publications
ISBN :
Book Description
February issue includes Appendix entitled Directory of United States Government periodicals and subscription publications; September issue includes List of depository libraries; June and December issues include semiannual index
Monthly Catalogue, United States Public Documents
Author :
Publisher :
Page : 1256 pages
File Size : 42,87 MB
Release : 1979
Category : Government publications
ISBN :
Book Description
National Semiconductor Metrology Program
Author : National Semiconductor Metrology Program (U.S.)
Publisher :
Page : 148 pages
File Size : 50,15 MB
Release : 1999
Category : Semiconductors
ISBN :
