Spring meeting of the Materials Research Society : proceedings of symposium // Materials Research Society ; 1992
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Release : 1992
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Release : 1992
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This volume contains the proceedings of Symposium F, "Nanophase and Nanocomposite Materials III," held November 29-December 2, at the 1999 MRS Fall Meeting in Boston, Massachusetts. This symposium is the third one of this series which began at the 1992 MRS Fall Meeting. The objective of this third symposium was to provide a forum to review the recent advances in nanophase and nanocomposite materials and to address the future prospects for these materials. Scientists from many parts of the world participated to present and discuss synthesis, processing, properties and applications of nanophase and nanocomposite materials. A total of about 240 papers from 23 countries were presented from academic institutions, government research organizations, and private industries. The 107 papers published in this proceedings have been refereed and presented as nine chapters.
Author : T. Hirai
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File Size : 27,98 MB
Release : 1993
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Author : G. M. Crean
Publisher : North Holland
Page : 338 pages
File Size : 18,89 MB
Release : 1993-01-01
Category : Ellipsometry
ISBN : 9780444899088
Reviews current research in the development and application of diagnostic techniques for advanced materials analysis and fabrication process control. Contributions discuss the emergence and evaluation of in situ optical diagnostic techniques, such as photoreflectance and spectroellipsometry.