Surface Structure Determination with X-ray Standing Waves
Author : J. Zegenhagen
Publisher :
Page : 73 pages
File Size : 47,97 MB
Release : 1993
Category : Standing waves
ISBN :
Surface Structure Determination with X-ray Standing Waves
Author : Jörg Zegenhagen
Publisher :
Page : 73 pages
File Size : 35,81 MB
Release : 1993
Category :
ISBN :
Book Description
Surface Science Reports
Author :
Publisher :
Page : 72 pages
File Size : 43,35 MB
Release : 1993
Category :
ISBN :
Book Description
Surface Structure Determination by LEED and X-rays
Author : Wolfgang Moritz
Publisher : Cambridge University Press
Page : 476 pages
File Size : 27,99 MB
Release : 2022-06-30
Category : Technology & Engineering
ISBN : 110830771X
Book Description
This timely text covers the theory and practice of surface and nanostructure determination by low-energy electron diffraction (LEED) and surface X-ray diffraction (SXRD): it is the first book on such quantitative structure analysis in over 30 years. It provides a detailed description of the theory, including cutting-edge developments and tested experimental methods. The focus is on quantitative techniques, while the qualitative interpretation of the LEED pattern without quantitative I(V) analysis is also included. Topics covered include the future study of nanoparticles, quasicrystals, thermal parameters, disorder and modulations of surfaces with LEED, with introductory sections enabling the non-specialist to follow all the concepts and applications discussed. With numerous colour figures throughout, this text is ideal for undergraduate and graduate students and researchers, whether experimentalists or theorists, in the fields of surface science, nanoscience and related technologies. It can serve as a textbook for graduate-level courses of one or two semesters.
Surface Structure Determination by LEED and X-rays
Author : Wolfgang Moritz
Publisher : Cambridge University Press
Page : 475 pages
File Size : 10,18 MB
Release : 2022-08-25
Category : Technology & Engineering
ISBN : 1108418090
Book Description
Discover exciting new developments and applications of LEED and X-ray diffraction, alongside detailed introductory material.
X-ray Standing Wave Technique, The: Principles And Applications
Author : Jorg Zegenhagen
Publisher : World Scientific
Page : 557 pages
File Size : 16,97 MB
Release : 2013-01-30
Category : Science
ISBN : 9814513105
Book Description
The X-ray standing wave (XSW) technique is an X-ray interferometric method combining diffraction with a multitude of spectroscopic techniques. It is extremely powerful for obtaining information about virtually all properties of surfaces and interfaces on the atomic scale. However, as with any other technique, it has strengths and limitations. The proper use and necessary understanding of this method requires knowledge in quite different fields of physics and technology. This volume presents comprehensively the theoretical background, technical requirements and distinguished experimental highlights of the technique. Containing contributions from the most prominent experts of the technique, such as Andre Authier, Boris Batterman, Michael J Bedzyk, Jene Golovchenko, Victor Kohn, Michail Kovalchuk, Gerhard Materlik and D Phil Woodruff, the book equips scientists with all the necessary information and knowledge to understand and use the XSW technique in practically all applications.
Surface Structure Determination by X-ray Diffraction
Author : Robert Feidenhans'l
Publisher :
Page : 84 pages
File Size : 15,28 MB
Release : 1989
Category :
ISBN :
Book Description
X-ray Standing Wave Imaging of Metal Atoms on Semiconductor and Oxide Surfaces
Author : Anthony Atilano Escuadro
Publisher :
Page : pages
File Size : 10,16 MB
Release : 2005
Category :
ISBN :
Book Description
The 1/3 monolayer (ML) Sn/Si(III)-(√3 x √3)R30° surface structure has been extensively studied using x-ray standing waves (XSW). The summation of several XSW measured hkl Fourier components results in a three-dimensional, model-independent direct-space image of the Sn atomic distribution. While the image demonstrates that the Sn atoms are located at Si(111) T4-adsorption sites, it alone cannot determine whether the Sn atomic distribution is flat or asymmetric. However, conventional XSW analysis can make this distinction, concluding that one-third of the Sn atoms are located 0.26 A higher than the remaining two-thirds. This "one up and two down" distribution is consistent with the vertical displacements predicted by a dynamical fluctuations model. A second sample prepared in a slightly different manner exhibits the same long-range surface symmetry, but a direct space image clearly reveals that a significant fraction of the Sn atoms in the second surface have substituted for Si atoms in the bottom of the Si surface bilayer.
Modern Techniques of Surface Science
Author : D. P. Woodruff
Publisher : Cambridge University Press
Page : 612 pages
File Size : 35,31 MB
Release : 1994-03-03
Category : Science
ISBN : 9780521424981
Book Description
Revised and expanded second edition of the standard work on new techniques for studying solid surfaces.
Surface Analysis
Author : John C. Vickerman
Publisher : John Wiley & Sons
Page : 690 pages
File Size : 22,23 MB
Release : 2011-08-10
Category : Technology & Engineering
ISBN : 1119965519
Book Description
This completely updated and revised second edition of Surface Analysis: The Principal Techniques, deals with the characterisation and understanding of the outer layers of substrates, how they react, look and function which are all of interest to surface scientists. Within this comprehensive text, experts in each analysis area introduce the theory and practice of the principal techniques that have shown themselves to be effective in both basic research and in applied surface analysis. Examples of analysis are provided to facilitate the understanding of this topic and to show readers how they can overcome problems within this area of study.
