Symposium on X-Ray and Electron Probe Analysis
Author :
Publisher :
Page : 230 pages
File Size : 24,66 MB
Release : 1964
Category : Probes (Electronic instruments)
ISBN :
Author :
Publisher :
Page : 230 pages
File Size : 24,66 MB
Release : 1964
Category : Probes (Electronic instruments)
ISBN :
Author :
Publisher : ASTM International
Page : 216 pages
File Size : 44,54 MB
Release : 1962
Category : Electron metallography
ISBN :
Author :
Publisher :
Page : 1064 pages
File Size : 16,68 MB
Release : 1974
Category : Nuclear energy
ISBN :
Author : Abrams H.
Publisher : ASTM International
Page : 244 pages
File Size : 46,36 MB
Release : 1986
Category : Technology & Engineering
ISBN : 9780803105102
Author : Gottfried Möllenstedt
Publisher : Springer Science & Business Media
Page : 624 pages
File Size : 41,11 MB
Release : 2013-06-29
Category : Science
ISBN : 3662121085
The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanford, California in 1962, and at Orsay, Francein 1965. The participants in the 1968 Conference came from the following countries: Germany 140, France 60, Great Britain 55, USA 20, Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine, Poland, South Africa. As at the latest congress in Paris the following central topics were treated: General problems of X-ray optics, physical bases of electron beam microanalysis, quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal lurgy, mineralogy, and biology. An exhibition showing some of the most modern instruments formed an important part of the conference. The Springer-Verlag, Heidelberg, deserves thanks for the careful and speedy work they have performed in printing these conference proceedings. We are further indebted to all contributors of this volume for their kind cooperation. Tübingen, August 1969 G. MöLLENSTEDT and K. H.
Author : George F. Vander Voort
Publisher : ASTM International
Page : 450 pages
File Size : 34,69 MB
Release : 1993
Category : Fatigue
ISBN : 0803114842
Author : National Library of Medicine (U.S.)
Publisher :
Page : 1174 pages
File Size : 37,19 MB
Release : 1982
Category : Medicine
ISBN :
First multi-year cumulation covers six years: 1965-70.
Author : United States. National Bureau of Standards
Publisher :
Page : 852 pages
File Size : 41,15 MB
Release : 1966
Category : Electrochemical analysis
ISBN :
Author : Bourdon Francis Scribner
Publisher :
Page : 112 pages
File Size : 48,66 MB
Release : 1966
Category : Spectrum analysis
ISBN :
Activities in optical spectrometry included development of programs for calculations on a time-sharing computer, measurement of arc temperatures, applications of the laser probe and the plasma jet, and studies on atomic absorption spectrometry. In x-ray spectroscopy, there were some modifications of equipment, improvements in computation methods, and several applications. Improvements and additions were made to the electron probe analyzer, along with studies on measurement techniques, including nondispersive analysis and computation procedures. The spark-source mass spectrometer was also modified, and a new analog computer has been built and tested for reduction of photographic plate data; applications of this instrument to analyses of pure materials are described. Enrichment methods are being studied for the analysis of pure materials by emission spectroscopy, particularly with an electro-deposition technique. Homogeneity studies and analyses were performed in the development of standard reference materials. (Author).
Author : Charles Barrett
Publisher : Springer Science & Business Media
Page : 582 pages
File Size : 44,11 MB
Release : 2013-06-29
Category : Science
ISBN : 1461399661
The application of solid-state detectors of high energy resolution to x-ray spectrometry, and the increasing use of compu ters in both measurement and data evaluation, are giving a new stimulus to x-ray techniques in analytical chemistry. The Twentieth Annual Denver X-ray Conference reflects this renewed interest in several ways. The invited papers, grouped in Session I, review the charac teristics of the detectors used in the measurement of x-rays. One paper is dedicated to the detection of single ions. Although such a subject may appear to be marginal to the purposes of the Denver Conference, we must recognize the affinity of techniques applied to similar purposes. Ion probe mass spectrometry is dedicated to tasks similar to those performed by x-ray spectrometry with the electron probe microanalyzer. Scientists and technologists will see these two techniques discussed in the same meetings. The discussion of automation and programming is not limited to the two invited speakers, but extends to papers presented in more than one session. The matter of fluorescence analysis by isotope- and tube-excitation will also be of great interest to those concerned with the practical applications of x-ray techniques. The communications contained in this volume, and the lively discussions which frequently followed the presentation of papers, attest to the vitality of the subjects which are the concern of the Annual Denver X-ray Conference.