Techniques for Enhancing Reliability in VLSI Circuits


Book Description

Several techniques at the architectural level to detect soft errors with minimal performance overhead, that make use of data, information, temporal and spatial redundancy are proposed. The techniques are designed in such a way that much of their latency overhead can be hidden by the latency of other functional operations. It is shown that the proposed methodologies can be implemented with negligible or minimal performance overhead hidden by critical path operations in the datapath. In designs with large peak power values, high current spikes cause noise within the power supply creating timing issues in the circuit which affect its functionality. A path clustering algorithm is proposed which attempts to normalize the current draw in the circuit over the circuit's clock period by delaying the start times of certain paths. By reducing the number of paths starting at a time instance, we reduce the amount of current drawn from the power supply is reduced. Experimental results indicate a reduction of up to 72\% in peak power values when tested on the ISCAS '85 and OpenCores benchmarks. Variations in VLSI designs come from process, voltage supply, and Temperature (PVT). These variations in the design cause non-ideal behavior at random internal nodes which impacts the timing of the design. A variation aware circuit level design methodology is presented in this dissertation in which the architecture dynamically stretches the clock when the effect of an variation effects are observed within the circuit during computations. While previous research efforts found are directed towards reducing variation effects, this technique offers an alternative approach to adapt dynamically to variation effects. The design technique is shown to increase in timing yield on ITC '99 benchmark circuits by an average of 41\% with negligible area overhead.




Lifetime Reliability-aware Design of Integrated Circuits


Book Description

This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits.




Circuit Design for Reliability


Book Description

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.




Soft Error Reliability of VLSI Circuits


Book Description

This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today’s reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.




Analysis and Design of Resilient VLSI Circuits


Book Description

This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi?cant rate, making it more dif?cult to design reliable VLSI circuits. Hence, it is important to ef?ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant.







Hot-Carrier Reliability of MOS VLSI Circuits


Book Description

As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluation of long-term reliability of MOS VLSI circuits is becoming an important problem. The assessment and improvement of reliability on the circuit level should be based on both the failure mode analysis and the basic understanding of the physical failure mechanisms observed in integrated circuits. Hot-carrier induced degrada tion of MOS transistor characteristics is one of the primary mechanisms affecting the long-term reliability of MOS VLSI circuits. It is likely to become even more important in future generation chips, since the down ward scaling of transistor dimensions without proportional scaling of the operating voltage aggravates this problem. A thorough understanding of the physical mechanisms leading to hot-carrier related degradation of MOS transistors is a prerequisite for accurate circuit reliability evaluation. It is also being recognized that important reliability concerns other than the post-manufacture reliability qualification need to be addressed rigorously early in the design phase. The development and use of accurate reliability simulation tools are therefore crucial for early assessment and improvement of circuit reliability : Once the long-term reliability of the circuit is estimated through simulation, the results can be compared with predetermined reliability specifications or limits. If the predicted reliability does not satisfy the requirements, appropriate design modifications may be carried out to improve the resistance of the devices to degradation.




AI Techniques for Reliability Prediction for Electronic Components


Book Description

In the industry of manufacturing and design, one major constraint has been enhancing operating performance using less time. As technology continues to advance, manufacturers are looking for better methods in predicting the condition and residual lifetime of electronic devices in order to save repair costs and their reputation. Intelligent systems are a solution for predicting the reliability of these components; however, there is a lack of research on the advancements of this smart technology within the manufacturing industry. AI Techniques for Reliability Prediction for Electronic Components provides emerging research exploring the theoretical and practical aspects of prediction methods using artificial intelligence and machine learning in the manufacturing field. Featuring coverage on a broad range of topics such as data collection, fault tolerance, and health prognostics, this book is ideally designed for reliability engineers, electronic engineers, researchers, scientists, students, and faculty members seeking current research on the advancement of reliability analysis using AI.




Linearization and Efficiency Enhancement Techniques for Silicon Power Amplifiers


Book Description

This book provides an overview of current efficiency enhancement and linearization techniques for silicon power amplifier designs. It examines the latest state of the art technologies and design techniques to address challenges for RF cellular mobile, base stations, and RF and mmW WLAN applications. Coverage includes material on current silicon (CMOS, SiGe) RF and mmW power amplifier designs, focusing on advantages and disadvantages compared with traditional GaAs implementations. With this book you will learn: The principles of linearization and efficiency improvement techniques The architectures allowing the optimum design of multimode Si RF and mmW power amplifiers How to make designs more efficient by employing new design techniques such as linearization and efficiency improvement Layout considerations Examples of schematic, layout, simulation and measurement results Addresses the problems of high power generation, faithful construction of non-constant envelope constellations, and efficient and well control power radiation from integrated silicon chips Demonstrates how silicon technology can solve problems and trade-offs of power amplifier design, including price, size, complexity and efficiency Written and edited by the top contributors to the field