Temperature Variation of the Optical Properties of Thin Dielectric Films
Author : Philip H. Doolittle
Publisher :
Page : 82 pages
File Size : 18,44 MB
Release : 1958
Category : Dielectrics
ISBN :
Author : Philip H. Doolittle
Publisher :
Page : 82 pages
File Size : 18,44 MB
Release : 1958
Category : Dielectrics
ISBN :
Author : Norman N. Axelrod
Publisher :
Page : 302 pages
File Size : 14,85 MB
Release : 1968
Category : Science
ISBN :
Author : O. S. Heavens
Publisher : Courier Corporation
Page : 276 pages
File Size : 11,96 MB
Release : 1991-01-01
Category : Science
ISBN : 0486669246
Authoritative reference treats the formation, structure, optical properties, and uses of thin solid films, emphasizing causes of their unusual qualities. 162 figures. 19 tables. 1955 edition.
Author : Safa Kasap
Publisher : Springer
Page : 1536 pages
File Size : 14,90 MB
Release : 2017-10-04
Category : Technology & Engineering
ISBN : 331948933X
The second, updated edition of this essential reference book provides a wealth of detail on a wide range of electronic and photonic materials, starting from fundamentals and building up to advanced topics and applications. Its extensive coverage, with clear illustrations and applications, carefully selected chapter sequencing and logical flow, makes it very different from other electronic materials handbooks. It has been written by professionals in the field and instructors who teach the subject at a university or in corporate laboratories. The Springer Handbook of Electronic and Photonic Materials, second edition, includes practical applications used as examples, details of experimental techniques, useful tables that summarize equations, and, most importantly, properties of various materials, as well as an extensive glossary. Along with significant updates to the content and the references, the second edition includes a number of new chapters such as those covering novel materials and selected applications. This handbook is a valuable resource for graduate students, researchers and practicing professionals working in the area of electronic, optoelectronic and photonic materials.
Author : Maurice H. Francombe
Publisher : Elsevier
Page : 385 pages
File Size : 33,77 MB
Release : 2013-10-22
Category : Science
ISBN : 1483144933
Physics of Thin Films: Advances in Research and Development, Volume 6 reviews the rapid progress that has been made in research and development concerning the physics of thin films, with emphasis on metallic films. Topics covered include anodic oxide films, thin metal films and wires, and multilayer magnetic films. This volume is comprised of five chapters and begins with a discussion on the dielectric properties and the technique of plasma anodization which are relevant to the applications of anodic oxide films in electronic devices. Conduction, polarization, and dielectric breakdown effects are also considered. The next chapter examines studies on size-dependent electrical conduction in thin metal films and wires, paying particular attention to both classical and quantum size effects and some of the anisotropic characteristics of epitaxial metal films. The reader is then introduced to the optical properties of metal films and interactions in multilayer magnetic films. This text concludes with a chapter that looks at diffusion in metallic films and presents experimental results for phase-forming systems, miscible systems, and lateral diffusion. This monograph will be of value to students and practitioners of physics, especially those interested in thin films.
Author : Kwang-Su Lee
Publisher :
Page : 108 pages
File Size : 41,51 MB
Release : 2002
Category :
ISBN :
Author : Hiroyuki Fujiwara
Publisher : John Wiley & Sons
Page : 388 pages
File Size : 24,77 MB
Release : 2007-09-27
Category : Technology & Engineering
ISBN : 9780470060186
Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data analysis of results obtained from SE, Fundamental data analyses, principles and physical backgrounds and the various materials used in different fields from LSI industry to biotechnology are described. The final chapter describes the latest developments of real-time monitoring and process control which have attracted significant attention in various scientific and industrial fields.
Author : Michael Ray Jacobson
Publisher :
Page : 244 pages
File Size : 41,49 MB
Release : 1990
Category : Technology & Engineering
ISBN :
Author :
Publisher :
Page : 312 pages
File Size : 49,30 MB
Release : 1991
Category : Aeronautics
ISBN :
Author : Norman N. Axelrod
Publisher :
Page : 283 pages
File Size : 10,80 MB
Release : 1970
Category : Dielectrics
ISBN :