The Optical Principles of the Diffraction of X-rays
Author : R. W. James
Publisher :
Page : 664 pages
File Size : 45,63 MB
Release : 1967
Category : X-ray crystallography
ISBN :
Author : R. W. James
Publisher :
Page : 664 pages
File Size : 45,63 MB
Release : 1967
Category : X-ray crystallography
ISBN :
Author : Reginald W. James
Publisher :
Page : 623 pages
File Size : 12,72 MB
Release : 1950
Category :
ISBN :
Author : Reginald W. James
Publisher :
Page : 664 pages
File Size : 42,14 MB
Release : 1965
Category :
ISBN :
Author : R. W. James
Publisher :
Page : 623 pages
File Size : 19,1 MB
Release : 1950
Category :
ISBN :
Author : C. Suryanarayana
Publisher : Springer Science & Business Media
Page : 275 pages
File Size : 20,59 MB
Release : 2013-06-29
Category : Technology & Engineering
ISBN : 1489901485
In this, the only book available to combine both theoretical and practical aspects of x-ray diffraction, the authors emphasize a "hands on" approach through experiments and examples based on actual laboratory data. Part I presents the basics of x-ray diffraction and explains its use in obtaining structural and chemical information. In Part II, eight experimental modules enable the students to gain an appreciation for what information can be obtained by x-ray diffraction and how to interpret it. Examples from all classes of materials -- metals, ceramics, semiconductors, and polymers -- are included. Diffraction patterns and Bragg angles are provided for students without diffractometers. 192 illustrations.
Author : Max Born
Publisher : CUP Archive
Page : 996 pages
File Size : 36,75 MB
Release : 2000-02-28
Category : Science
ISBN : 9780521784498
Principles of Optics is one of the classic science books of the twentieth century, and probably the most influential book in optics published in the past 40 years. The new edition is the first ever thoroughly revised and expanded edition of this standard text. Among the new material, much of which is not available in any other optics text, is a section on the CAT scan (computerized axial tomography), which has revolutionized medical diagnostics. The book also includes a new chapter on scattering from inhomogeneous media which provides a comprehensive treatment of the theory of scattering of scalar as well as of electromagnetic waves, including the Born series and the Rytov series. The chapter also presents an account of the principles of diffraction tomography - a refinement of the CAT scan - to which Emil Wolf, one of the authors, has made a basic contribution by formulating in 1969 what is generally regarded to be the basic theorem in this field. The chapter also includes an account of scattering from periodic potentials and its connection to the classic subject of determining the structure of crystals from X-ray diffraction experiments, including accounts of von Laue equations, Bragg's law, the Ewald sphere of reflection and the Ewald limiting sphere, both generalized to continuous media. These topics, although originally introduced in connection with the theory of X-ray diffraction by crystals, have since become of considerable relevance to optics, for example in connection with deep holograms. Other new topics covered in this new edition include interference with broad-band light, which introduces the reader to an important phenomenon discovered relatively recently by Emil Wolf, namely the generation of shifts of spectral lines and other modifications of spectra of radiated fields due to the state of coherence of a source. There is also a section on the so-called Rayleigh-Sommerfield diffraction theory which, in recent times, has been finding increasing popularity among optical scientists. There are also several new appendices, including one on energy conservation in scalar wavefields, which is seldom discussed in books on optics. The new edition of this standard reference will continue to be invaluable to advanced undergraduates, graduate students and researchers working in most areas of optics.
Author : V.G Tsirelson
Publisher : CRC Press
Page : 544 pages
File Size : 16,47 MB
Release : 1996-01-01
Category : Science
ISBN : 9780750302845
Electron Density and Bonding in Crystals: Principles, Theory and X-Ray Diffraction Experiments in Solid State Physics and Chemistry provides a comprehensive, unified account of the use of diffraction techniques to determine the distribution of electrons in crystals. The book discusses theoretical and practical techniques, the application of electron density studies to chemical bonding, and the determination of the physical properties of condensed matter. The book features the authors' own key contributions to the subject as well a thorough, critical summary of the extensive literature on electron density and bonding. Logically organized, coverage ranges from the theoretical and experimental basis of electron density determination to its impact on investigations of the nature of the chemical bond and its uses in determining electromagnetic and optical properties of crystals. The main text is supplemented by appendices that provide clear, concise guidance on aspects such as systems of units, quantum theory of atomic vibrations, atomic orbitals, and creation and annihilation operators. The result is a valuable compendium of modern knowledge on electron density distributions, making this reference a standard for crystallographers, condensed matter physicists, theoretical chemists, and materials scientists.
Author : Mario Birkholz
Publisher : John Wiley & Sons
Page : 378 pages
File Size : 16,48 MB
Release : 2006-05-12
Category : Technology & Engineering
ISBN : 3527607048
With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.
Author : Michael M. Woolfson
Publisher : Cambridge University Press
Page : 422 pages
File Size : 35,47 MB
Release : 1997-01-13
Category : Medical
ISBN : 9780521423595
A textbook for the student beginning a serious study of X-ray crystallography.
Author : Sir William Henry Bragg
Publisher :
Page : 712 pages
File Size : 21,16 MB
Release : 1962
Category : Crystallography
ISBN :