Book Description
"This is a textbook the gives the background of the stopping and range of ions in matter (www.SRIM.org). It is written to be the prime resource for those who use SRIM in scientific work."--Lulu.com.
Author : James F. Ziegler
Publisher : Lulu.com
Page : 683 pages
File Size : 26,5 MB
Release : 2008
Category : Ion bombardment
ISBN : 9780965420716
"This is a textbook the gives the background of the stopping and range of ions in matter (www.SRIM.org). It is written to be the prime resource for those who use SRIM in scientific work."--Lulu.com.
Author : H. Ryssel
Publisher : Springer Science & Business Media
Page : 377 pages
File Size : 15,61 MB
Release : 2012-12-06
Category : Science
ISBN : 3642687792
In recent years, ion implantation has developed into the major doping technique for integrated circuits. Several series of conferences have dealt with the application of ion implantation to semiconductors and other materials (Thousand Oaks 1970, Garmisch-Partenkirchen 1971, Osaka 1974, Warwick 1975, Boulder 1976, Budapest 1978, and Albany 1980). Another series of conferences was devoted more to implantation equipment and tech niques (Salford 1977, Trento 1978, and Kingston 1980). In connection with the Third International Conference on Ion Implantation: Equipment and Tech niques, held at Queen's University, ' Kingston, Ontario, Canada, July 8-11, 1980, a two-day instructional program was organized parallel to an implan tation conference for the first time. This implantation school concentra ted on aspects of implantation-equipment design. This book contains all lectures presented at the International Ion Implantation School organized in connection with the Fourth International Conference on Ion Implantation: Equipment and Techniques, held at the Convention Center, Berchtesgaden, Germany, September 13-17, 1982. In con trast to the first .school, the main emphasis in thiS school was placed on practical aspects of implanter operation and application. In three chap ters, various machine aspects of ion implantation (general concepts, ion sources, safety, calibration, dOSimetry), range distributions (stopping power, range profiles), and measuring techniques (electrical and nonelec tri ca 1 measu ri ng techni ques, annea 1 i ng) are di scussed. In the appendi x, a review of the state of the art in modern implantation equipment is given.
Author : James F. Ziegler
Publisher :
Page : 0 pages
File Size : 30,8 MB
Release : 1985
Category :
ISBN :
Author : U. Littmark
Publisher : Pergamon
Page : 506 pages
File Size : 31,53 MB
Release : 1980
Category : Science
ISBN :
Author : Hans Henrik Andersen
Publisher : Pergamon
Page : 342 pages
File Size : 48,70 MB
Release : 1977
Category : Science
ISBN :
Author : Michael Nastasi
Publisher : Cambridge University Press
Page : 572 pages
File Size : 27,84 MB
Release : 1996-03-29
Category : Science
ISBN : 052137376X
Comprehensive guide to an important materials science technique for students and researchers.
Author : N.J Carron
Publisher : CRC Press
Page : 384 pages
File Size : 17,55 MB
Release : 2006-11-10
Category : Science
ISBN : 1420012371
Identifying where to access data, extracting a needed subset from available resources, and knowing how to interpret the format in which data are presented can be time-consuming tasks for scientists and engineers. By collecting all of this information and providing a background in physics, An Introduction to the Passage of Energetic Particles thr
Author : J.F. Ziegler
Publisher : Elsevier
Page : 324 pages
File Size : 41,85 MB
Release : 2013-10-22
Category : Science
ISBN : 1483100960
Hydrogen: Stopping Powers and Ranges in All Elements, Volume 3 of The Stopping and Ranges of Ions in Matter, provides a nearly complete presentation of absolute experimental energy loss data for hydrogen over the energy range 10 keV
Author : Inga Tolstikhina
Publisher : Springer
Page : 228 pages
File Size : 48,5 MB
Release : 2018-02-28
Category : Science
ISBN : 3319749927
This book provides an overview of the recent experimental and theoretical results on interactions of heavy ions with gaseous, solid and plasma targets from the perspective of atomic physics. The topics discussed comprise stopping power, multiple-electron loss and capture processes, equilibrium and non-equilibrium charge-state fractions in penetration of fast ion beams through matter including relativistic domain. It also addresses mean charge-states and equilibrium target thickness in ion-beam penetrations, isotope effects in low-energy electron capture, lifetimes of heavy ion beams, semi-empirical formulae for effective cross sections. The book is intended for researchers and graduate students working in atomic, plasma and accelerator physics.
Author : Ishaq Ahmad
Publisher : BoD – Books on Demand
Page : 190 pages
File Size : 21,43 MB
Release : 2018-07-18
Category : Science
ISBN : 178923414X
Ion beam of various energies is a standard research tool in many areas of science, from basic physics to diverse areas in space science and technology, device fabrications, materials science, environment science, and medical sciences. It is an advance and versatile tool to frequently discover applications across a broad range of disciplines and fields. Moreover, scientists are continuously improving the ion beam sources and accelerators to explore ion beam at the forefront of scientific endeavours. This book provides a glance view on MeV ion beam applications, focused ion beam generation and its applications as well as practical applications of ion implantation.