Book Description
Includes bibliographical references and index.
Author : EDFAS Desk Reference Committee
Publisher : ASM International
Page : 673 pages
File Size : 38,35 MB
Release : 2011
Category : Technology & Engineering
ISBN : 1615037268
Includes bibliographical references and index.
Author :
Publisher :
Page : 588 pages
File Size : 13,47 MB
Release : 1991
Category : Hybrid integrated circuits
ISBN :
Author :
Publisher : ASM International
Page : 813 pages
File Size : 47,45 MB
Release : 2004-01-01
Category : Technology & Engineering
ISBN : 0871708043
For newcomers cast into the waters to sink or swim as well as seasoned professionals who want authoritative guidance desk-side, this hefty volume updates the previous (1999) edition. It contains the work of expert contributors who rallied to the job in response to a committee's call for help (the committee was assigned to the update by the Electron
Author :
Publisher :
Page : 314 pages
File Size : 13,65 MB
Release : 1995
Category : Micromachining
ISBN :
Author : Abraham Landzberg
Publisher : Springer Science & Business Media
Page : 663 pages
File Size : 17,23 MB
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 1461520290
The world of microelectronics is filled with cusses measurement systems, manufacturing many success stories. From the use of semi control techniques, test, diagnostics, and fail ure analysis. It discusses methods for modeling conductors for powerful desktop computers to their use in maintaining optimum engine per and reducing defects, and for preventing de formance in modem automobiles, they have fects in the first place. The approach described, clearly improved our daily lives. The broad while geared to the microelectronics world, has useability of the technology is enabled, how applicability to any manufacturing process of similar complexity. The authors comprise some ever, only by the progress made in reducing their cost and improving their reliability. De of the best scientific minds in the world, and fect reduction receives a significant focus in our are practitioners of the art. The information modem manufacturing world, and high-quality captured here is world class. I know you will diagnostics is the key step in that process. find the material to be an excellent reference in of product failures enables step func Analysis your application. tion improvements in yield and reliability. which works to reduce cost and open up new Dr. Paul R. Low applications and technologies. IBM Vice President and This book describes the process ofdefect re of Technology Products General Manager duction in the microelectronics world.
Author : Sen Zhang
Publisher : Springer Science & Business Media
Page : 143 pages
File Size : 48,88 MB
Release : 2014-04-10
Category : Science
ISBN : 3642548393
This book mainly focuses on the investigation of the electric-field control of magnetism and spin-dependent transportation based on a Co40Fe40B20(CoFeB)/Pb(Mg1/3Nb2/3)0.7Ti0.3O3(PMN-PT) multiferroic heterostructure. Methods of characterization and analysis of the multiferroic properties with in situ electric fields are induced to detect the direct magnetoelectric (ME) coupling. A switchable and non-volatile electric field control of magnetization in CoFeB/PMN-PT(001) structures is observed at room temperature, and the mechanism of direct coupling between the ferroelectric domain and ferromagnetic film due to the combined action of 109° ferroelastic domain switching in PMN-PT and the absence of magnetocrystalline anisotropy in CoFeB is demonstrated. Moreover, the electric-field control of giant magnetoresistance is achieved in a CoFeB-based spin valve deposited on top of (011) oriented PMN-PT, which offers an avenue for implementing electric-writing and magnetic-reading random access memory at room temperature. Readers will learn the basic properties of multiferroic materials, many useful techniques related to characterizing multiferroics and the interesting ME effect in CoFeB/PMN-PT structures, which is significant for applications.
Author :
Publisher :
Page : 416 pages
File Size : 13,13 MB
Release : 2007
Category : Microelectronics
ISBN :
Author : United States. Energy Research and Development Administration
Publisher :
Page : 818 pages
File Size : 47,25 MB
Release : 1977
Category : Medicine
ISBN :
Author : Anupama B. Kaul
Publisher : CRC Press
Page : 467 pages
File Size : 15,49 MB
Release : 2017-12-19
Category : Science
ISBN : 1351832387
Composed of contributions from top experts, Microelectronics to Nanoelectronics: Materials, Devices and Manufacturability offers a detailed overview of important recent scientific and technological developments in the rapidly evolving nanoelectronics arena. Under the editorial guidance and technical expertise of noted materials scientist Anupama B. Kaul of California Institute of Technology’s Jet Propulsion Lab, this book captures the ascent of microelectronics into the nanoscale realm. It addresses a wide variety of important scientific and technological issues in nanoelectronics research and development. The book also showcases some key application areas of micro-electro-mechanical-systems (MEMS) that have reached the commercial realm. Capitalizing on Dr. Kaul’s considerable technical experience with micro- and nanotechnologies and her extensive research in prestigious academic and industrial labs, the book offers a fresh perspective on application-driven research in micro- and nanoelectronics, including MEMS. Chapters explore how rapid developments in this area are transitioning from the lab to the market, where new and exciting materials, devices, and manufacturing technologies are revolutionizing the electronics industry. Although many micro- and nanotechnologies still face major scientific and technological challenges and remain within the realm of academic research labs, rapid advances in this area have led to the recent emergence of new applications and markets. This handbook encapsulates that exciting recent progress by providing high-quality content contributed by international experts from academia, leading industrial institutions—such as Hewlett-Packard—and government laboratories including the U.S. Department of Energy’s Sandia National Laboratory. Offering something for everyone, from students to scientists to entrepreneurs, this book showcases the broad spectrum of cutting-edge technologies that show significant promise for electronics and related applications in which nanotechnology plays a key role.
Author : United States. Patent and Trademark Office
Publisher :
Page : 824 pages
File Size : 44,26 MB
Release : 2002
Category : Patents
ISBN :