Author : Challa S.S.R. Kumar
Publisher : Springer Science & Business Media
Page : 718 pages
File Size : 48,67 MB
Release : 2013-12-09
Category : Science
ISBN : 3642389341
Third volume of a 40volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Transmission electron microscopy characterization of nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.
Author : Challa S.S.R. Kumar
Publisher : Springer
Page : 0 pages
File Size : 49,47 MB
Release : 2016-08-23
Category : Science
ISBN : 9783662524626
Third volume of a 40volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Transmission electron microscopy characterization of nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.
Author : Osvaldo de Oliveira Jr
Publisher : William Andrew
Page : 224 pages
File Size : 47,72 MB
Release : 2017-03-18
Category : Technology & Engineering
ISBN : 0323497799
Nanocharacterization Techniques covers the main characterization techniques used in nanomaterials and nanostructures. The chapters focus on the fundamental aspects of characterization techniques and their distinctive approaches. Significant advances that have taken place over recent years in refining techniques are covered, and the mathematical foundations needed to use the techniques are also explained in detail. This book is an important reference for materials scientists and engineers looking for a through analysis of nanocharacterization techniques in order to establish which is best for their needs. - Includes a detailed analysis of different nanocharacterization techniques, allowing readers to explore which one is best for their particular needs - Provides examples of how each characterization technique has been used, giving readers a greater understanding of how each technique can be profitably used - Covers the mathematical background needed to utilize each of these techniques to their best effect, meaning that readers can gain a full understanding of the theoretical principles behind each technique covered - Serves as an important, go-to reference for materials scientists and engineers
Author : Weilie Zhou
Publisher : Springer Science & Business Media
Page : 533 pages
File Size : 19,13 MB
Release : 2007-03-09
Category : Technology & Engineering
ISBN : 0387396209
This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.
Author : Sabu Thomas
Publisher : Elsevier
Page : 434 pages
File Size : 28,45 MB
Release : 2017-05-17
Category : Technology & Engineering
ISBN : 0323461476
Microscopy Methods in Nanomaterials Characterization fills an important gap in the literature with a detailed look at microscopic and X-ray based characterization of nanomaterials. These microscopic techniques are used for the determination of surface morphology and the dispersion characteristics of nanomaterials. This book deals with the detailed discussion of these aspects, and will provide the reader with a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc. In addition, it covers the latest developments and trends morphological characterization using a variety of microscopes. Materials scientists, materials engineers and scientists in related disciplines, including chemistry and physics, will find this to be a detailed, method-orientated guide to microscopy methods of nanocharacterization. - Takes a method-orientated approach that includes case studies that illustrate how to carry out each characterization technique - Discusses the advantages and disadvantages of each microscopy characterization technique, giving the reader greater understanding of conditions for different techniques - Presents an in-depth discussion of each technique, allowing the reader to gain a detailed understanding of each
Author : Khan Maaz
Publisher : BoD – Books on Demand
Page : 362 pages
File Size : 18,34 MB
Release : 2015-09-02
Category : Science
ISBN : 9535121502
This book The Transmission Electron Microscope abundantly illustrates necessary insight and guidance of this powerful and versatile material characterization technique with complete figures and thorough explanations. The second edition of the book presents deep understanding of new techniques from introduction to advance levels, covering in-situ transmission electron microscopy, electron and focused ion beam microscopy, and biological diagnostic through TEM. The chapters cover all major aspects of transmission electron microscopy and their uses in material characterization with special emphasis on both the theoretical and experimental aspects of modern electron microscopy techniques. It is believed that this book will provide a solid foundation of electron microscopy to the students, scientists, and engineers working in the field of material science and condensed matter physics.
Author : B.S. Murty
Publisher : Springer Science & Business Media
Page : 256 pages
File Size : 11,30 MB
Release : 2013-12-06
Category : Technology & Engineering
ISBN : 3642280307
This book is meant to serve as a textbook for beginners in the field of nanoscience and nanotechnology. It can also be used as additional reading in this multifaceted area. It covers the entire spectrum of nanoscience and technology: introduction, terminology, historical perspectives of this domain of science, unique and widely differing properties, advances in the various synthesis, consolidation and characterization techniques, applications of nanoscience and technology and emerging materials and technologies.
Author : Simonpietro Agnello
Publisher : John Wiley & Sons
Page : 500 pages
File Size : 15,67 MB
Release : 2021-09-08
Category : Technology & Engineering
ISBN : 1119697328
SPECTROSCOPY FOR MATERIALS CHARACTERIZATION Learn foundational and advanced spectroscopy techniques from leading researchers in physics, chemistry, surface science, and nanoscience In Spectroscopy for Materials Characterization, accomplished researcher Simonpietro Agnello delivers a practical and accessible compilation of various spectroscopy techniques taught and used to today. The book offers a wide-ranging approach taught by leading researchers working in physics, chemistry, surface science, and nanoscience. It is ideal for both new students and advanced researchers studying and working with spectroscopy. Topics such as confocal and two photon spectroscopy, as well as infrared absorption and Raman and micro-Raman spectroscopy, are discussed, as are thermally stimulated luminescence and spectroscopic studies of radiation effects on optical materials. Each chapter includes a basic introduction to the theory necessary to understand a specific technique, details about the characteristic instrumental features and apparatuses used, including tips for the appropriate arrangement of a typical experiment, and a reproducible case study that shows the discussed techniques used in a real laboratory. Readers will benefit from the inclusion of: Complete and practical case studies at the conclusion of each chapter to highlight the concepts and techniques discussed in the material Citations of additional resources ideal for further study A thorough introduction to the basic aspects of radiation matter interaction in the visible-ultraviolet range and the fundamentals of absorption and emission A rigorous exploration of time resolved spectroscopy at the nanosecond and femtosecond intervals Perfect for Master and Ph.D. students and researchers in physics, chemistry, engineering, and biology, Spectroscopy for Materials Characterization will also earn a place in the libraries of materials science researchers and students seeking a one-stop reference to basic and advanced spectroscopy techniques.
Author : Oliver Diwald
Publisher : John Wiley & Sons
Page : 903 pages
File Size : 21,60 MB
Release : 2021-09-14
Category : Technology & Engineering
ISBN : 1119436745
Metal Oxide Nanoparticles A complete nanoparticle resource for chemists and industry professionals Metal oxide nanoparticles are integral to a wide range of natural and technological processes—from mineral transformation to electronics. Additionally, the fields of engineering, electronics, energy technology, and electronics all utilize metal oxide nanoparticle powders. Metal Oxide Nanoparticles: Formation, Functional Properties, and Interfaces presents readers with the most relevant synthesis and formulation approaches for using metal oxide nanoparticles as functional materials. It covers common processing routes and the assessment of physical and chemical particle properties through comprehensive and complementary characterization methods. This book will serve as an introduction to nanoparticle formulation, their interface chemistry and functional properties at the nanoscale. It will also act as an in-depth resource, sharing detailed information on advanced approaches to the physical, chemical, surface, and interface characterization of metal oxide nanoparticle powders and dispersions. Addresses the application of metal oxide nanoparticles and its economic impact Examines particle synthesis, including the principles of selected bottom-up strategies Explores nanoparticle formulation—a selection of processing and application routes Discusses the significance of particle surfaces and interfaces on structure formation, stability and functional materials properties Covers metal oxide nanoparticle characterization at different length scales With this valuable resource, academic researchers, industrial chemists, and PhD students can all gain insight into the synthesis, properties, and applications of metal oxide nanoparticles.
Author : Alina Bruma
Publisher : CRC Press
Page : 162 pages
File Size : 23,20 MB
Release : 2020-12-22
Category : Technology & Engineering
ISBN : 0429516169
Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications The information comprised in this book is focused on discussing the latest approaches in the recording of high-fidelity quantitative annular dark-field (ADF) data. It showcases the application of machine learning in electron microscopy and the latest advancements in image processing and data interpretation for materials notoriously difficult to analyze using scanning transmission electron microscopy (STEM). It also highlights strategies to record and interpret large electron diffraction datasets for the analysis of nanostructures. This book: Discusses existing approaches for experimental design in the recording of high-fidelity quantitative ADF data Presents the most common types of scintillator-photomultiplier ADF detectors, along with their strengths and weaknesses. Proposes strategies to minimize the introduction of errors from these detectors and avenues for dealing with residual errors Discusses the practice of reliable multiframe imaging, along with the benefits and new experimental opportunities it presents in electron dose or dose-rate management Focuses on supervised and unsupervised machine learning for electron microscopy Discusses open data formats, community-driven software, and data repositories Proposes methods to process information at both global and local scales, and discusses avenues to improve the storage, transfer, analysis, and interpretation of multidimensional datasets Provides the spectrum of possibilities to study materials at the resolution limit by means of new developments in instrumentation Recommends methods for quantitative structural characterization of sensitive nanomaterials using electron diffraction techniques and describes strategies to collect electron diffraction patterns for such materials This book helps academics, researchers, and industry professionals in materials science, chemistry, physics, and related fields to understand and apply computer-science–derived analysis methods to solve problems regarding data analysis and interpretation of materials properties.
