VLSI Test Symposium, 21st IEEE.
Author : IEEE Computer Society Staff
Publisher :
Page : pages
File Size : 21,18 MB
Release : 2003
Category :
ISBN :
21st IEEE VLSI Test Symposium
Author :
Publisher : IEEE
Page : 432 pages
File Size : 22,90 MB
Release : 2003-01-01
Category : Technology & Engineering
ISBN : 9780769519241
Book Description
VTS 2003 is the twenty-first in a series of annual symposia that explore the state-of-the-art, and introduce innovative approaches, in the testing of electronic circuits and systems. The complexity of current generation ICs, combined with rapidly developing high density, high speed packaging and reduced design cycle time, has made it extremely difficult and expensive to comprehensively test electronic systems, and diagnose failed parts using traditional methods. This situation worsens as we move toward nanometer technologies.
VLSI Test Symposium (VTS, `98), 16th IEEE.
Author : IEEE, Society Staff
Publisher :
Page : pages
File Size : 48,67 MB
Release : 1998
Category :
ISBN :
Book Description
16th IEEE VLSI Test Symposium
Author :
Publisher :
Page : 520 pages
File Size : 32,31 MB
Release : 1998
Category : Application-specific integrated circuits
ISBN : 9780818684364
Book Description
Proceedings
Author : Ieee
Publisher : Institute of Electrical & Electronics Engineers(IEEE)
Page : 468 pages
File Size : 31,95 MB
Release : 2004
Category : Technology & Engineering
ISBN : 9780769521343
Book Description
The proceedings of the 21st IEEE VLSI test symposium (VTS (2003) describing innovations in the testing of integrated circuits and systems.
Special Issue on 16th IEEE VLSI Test Symposium (VTS 98)
Author : VLSI Test Symposium
Publisher :
Page : pages
File Size : 17,97 MB
Release : 1999
Category :
ISBN :
Book Description
VLSI Design and Test
Author : Brajesh Kumar Kaushik
Publisher : Springer
Page : 820 pages
File Size : 42,71 MB
Release : 2017-12-21
Category : Computers
ISBN : 9811074704
Book Description
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
IEEE VLSI Test Symposium
Author :
Publisher :
Page : 498 pages
File Size : 47,22 MB
Release : 2005
Category : Application-specific integrated circuits
ISBN :
Book Description
2021 IEEE 39th VLSI Test Symposium (VTS)
Author : Alberto Basio
Publisher :
Page : 0 pages
File Size : 45,56 MB
Release : 2021
Category : Integrated circuits
ISBN : 9781665419499
Book Description
2017 IEEE 35th VLSI Test Symposium (VTS).
Author :
Publisher :
Page : pages
File Size : 40,86 MB
Release : 2017
Category :
ISBN : 9781509044825
