X-Ray Diffraction by Disordered Lamellar Structures


Book Description

New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism - indispensable for such analyses - is well-illustrated by various examples, allowing this method to be easily adopted and even to be applied to other solids with lamellar or pseudo-lamellar structures.




X-Ray Diffraction


Book Description

In this, the only book available to combine both theoretical and practical aspects of x-ray diffraction, the authors emphasize a "hands on" approach through experiments and examples based on actual laboratory data. Part I presents the basics of x-ray diffraction and explains its use in obtaining structural and chemical information. In Part II, eight experimental modules enable the students to gain an appreciation for what information can be obtained by x-ray diffraction and how to interpret it. Examples from all classes of materials -- metals, ceramics, semiconductors, and polymers -- are included. Diffraction patterns and Bragg angles are provided for students without diffractometers. 192 illustrations.







X-Ray Diffraction


Book Description

Exploration of fundamentals of x-ray diffraction theory using Fourier transforms applies general results to various atomic structures, amorphous bodies, crystals, and imperfect crystals. 154 illustrations. 1963 edition.




Basic Concepts of X-Ray Diffraction


Book Description

Authored by a university professor deeply involved in X-ray diffraction-related research, this textbook is based on his lectures given to graduate students for more than 20 years. It adopts a well-balanced approach, describing basic concepts and experimental techniques, which make X-ray diffraction an unsurpassed method for studying the structure of materials. Both dynamical and kinematic X-ray diffraction is considered from a unified viewpoint, in which the dynamical diffraction in single-scattering approximation serves as a bridge between these two parts. The text emphasizes the fundamental laws that govern the interaction of X-rays with matter, but also covers in detail classical and modern applications, e.g., line broadening, texture and strain/stress analyses, X-ray mapping in reciprocal space, high-resolution X-ray diffraction in the spatial and wave vector domains, X-ray focusing, inelastic and time-resolved X-ray scattering. This unique scope, in combination with otherwise hard-to-find information on analytic expressions for simulating X-ray diffraction profiles in thin-film heterostructures, X-ray interaction with phonons, coherent scattering of Mossbauer radiation, and energy-variable X-ray diffraction, makes the book indispensable for any serious user of X-ray diffraction techniques. Compact and self-contained, this textbook is suitable for students taking X-ray diffraction courses towards specialization in materials science, physics, chemistry, or biology. Numerous clear-cut illustrations, an easy-to-read style of writing, as well as rather short, easily digestible chapters all facilitate comprehension.




X-Ray Diffraction for Materials Research


Book Description

X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.




X-Ray Diffraction


Book Description

Rigorous graduate-level text stresses modern applications to nonstructural problems such as temperature vibration effects, order-disorder phenomena, crystal imperfections, more. Problems. Six Appendixes include tables of values. Bibliographies.




Membrane Spectroscopy


Book Description

The last 10 years have seen an enormous growth in our understanding of the molecular organisation of biological membranes. Experimental methods have been devised to meas ure the translational and rotational mobility of lipids and proteins, thereby furnishing a quantitative basis for the concept of membrane fluidity. Likewise, the asymmetry of bi layer membranes as evidenced by the asymmetric insertion of proteins and lipids has been put on firm experimental ground. At higher molecular resolution it has been possible to provide a detailed pi2ture of the molecular conformation and dynamics of lipids and, to some extent, even of small peptides embedded in a bilayer matrix. Many of these achieve ments would not have been possible without the application of modem spectroscopic methods. Since these techniques are scattered in a variety of specialized textbooks the present monograph attempts to describe the key spectroscopic methods employed in present-day membrane research at an intermediate level. There is no question that the elusive detailed structure of the biological membrane demands a multiplicity of experi mental approaches and that no single spectroscopic method can cover the full range of physical phenomena encountered in a membrane. Much confusion in the literature has arisen by undue generalizations without considering the frequency range or other limi tations of the methods employed. It is to be hoped that the present monograph with its comprehensive description of most modem spectroscopic techniques, will contribute to- .




Flame Retardant Polymer Nanocomposites


Book Description

Flame Retardant Polymer Nanocomposites takes a comprehensive look at polymer nanocomposites for flame retardancy applications and includes nanocomposite fundamentals (theory, design, synthesis, characterization) as well as polymer flammability fundamentals with emphasis on how nanocomposites affect flammability. The book has practical examples from literature, patents, and existing commercial products. Readers can design new work based upon the material in the book or use it as a handy reference for interpreting existing work and results.




Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials


Book Description

Zeitschrift für Kristallographie. Supplement Volume 27 presents the complete Proceedings of all contributions to the V Size Strain Conference in Garmisch-Partenkirchen 2007: Lattice Defects Residual Stresses Texture in Thin Films and at Surfaces Line-Broadening Analysis and Line-Profile Fitting Diffraction/Microstructure Modeling Supplement Series of Zeitschrift für Kristallographie publishes Proceedings and Abstracts of international conferences on the interdisciplinary field of crystallography.