X-Rays and Extreme Ultraviolet Radiation


Book Description

Master the physics and understand the current applications of modern X-ray and EUV sources with this fully updated second edition.




Soft X-Rays and Extreme Ultraviolet Radiation


Book Description

This detailed, comprehensive book describes the fundamental properties of soft X-rays and extreme ultraviolet (EUV) radiation and discusses their applications in a wide variety of fields, including EUV lithography for semiconductor chip manufacture and soft X-ray biomicroscopy. The author begins by presenting the relevant basic principles such as radiation and scattering, wave propagation, diffraction, and coherence. He then goes on to examine a broad range of phenomena and applications. The topics covered include spectromicroscopy, EUV astronomy, synchrotron radiation, and soft X-ray lasers. The author also provides a wealth of useful reference material such as electron binding energies, characteristic emission lines and photo-absorption cross-sections. The book will be of great interest to graduate students and researchers in engineering, physics, chemistry, and the life sciences. It will also appeal to practising engineers involved in semiconductor fabrication and materials science.




Soft x-rays and extreme ultraviolet radiation


Book Description

This self-contained, comprehensive book describes the fundamental properties of soft X-rays and extreme ultraviolet (EUV) radiation and discusses their applications in a wide variety of fields, including EUV lithography for semiconductor chip manufacture and soft X-ray biomicroscopy. The book will be of great interest to graduate students, researchers and practising engineers.







Studyguide for Soft X-Rays and Extreme Ultraviolet Radiation by Attwood, David T., ISBN 9780521029971


Book Description

Never HIGHLIGHT a Book Again! Virtually all of the testable terms, concepts, persons, places, and events from the textbook are included. Cram101 Just the FACTS101 studyguides give all of the outlines, highlights, notes, and quizzes for your textbook with optional online comprehensive practice tests. Only Cram101 is Textbook Specific. Accompanys: 9780521029971 .




Studyguide for Soft X-Rays and Extreme Ultraviolet Radiation by Attwood, David T.


Book Description

Never HIGHLIGHT a Book Again Virtually all testable terms, concepts, persons, places, and events are included. Cram101 Textbook Outlines gives all of the outlines, highlights, notes for your textbook with optional online practice tests. Only Cram101 Outlines are Textbook Specific. Cram101 is NOT the Textbook. Accompanys: 9780521673761




Contribution of X-ray and Extreme Ultraviolet Radiation of Solar Flares to Sudden Frequency Deviations


Book Description

High time and intensity resolution satellite measurements of X-ray and extreme ultraviolet (EUV) radiation during solar flares are studied to determine the wavelength dependence of the flare radiation responsible for sudden frequency deviations (SFD). SFD's measure the flare-induced effects in the E and F1 regions of the ionosphere and are in effect like a broadband (1-1030 Å) detector for impulsive flare enhancements. He II 303.8 Å, O V 629.7 Å, H Ly [upsilon] 972.5 Å, C III 977.0 Å, and H Ly [alpha] 1215.7 Å were found to have essentially the same time dependence as the total ionizing radiation producing SFD's, except that they decay faster than the net 1-1030 Å radiation. Flare enhancements of Fe XV 284.1 Å, Fe XVI 335.3 Å, Si XII 499.3 Å. Mg X 625.3 Å, and Ne VIII 770.4 Å, which are normally coronal lines, appear to have a much slower time dependence than the radiation responsible for SFD's. X-rays in the 0.5-3 Å range are slightly slower than the radiation responsible for SFD's during the decay stage; 1-8 Å X-ray flares are slower, especially during the decay stages; and 8-20 Å flare radiation enhancements are slower throughout the entire SFD.




X-Rays and Extreme Ultraviolet Radiation


Book Description

With this fully updated second edition, readers will gain a detailed understanding of the physics and applications of modern X-ray and EUV radiation sources. Taking into account the most recent improvements in capabilities, coverage is expanded to include new chapters on free electron lasers (FELs), laser high harmonic generation (HHG), X-ray and EUV optics, and nanoscale imaging; a completely revised chapter on spatial and temporal coherence; and extensive discussion of the generation and applications of femtosecond and attosecond techniques. Readers will be guided step by step through the mathematics of each topic, with over 300 figures, 50 reference tables and 600 equations enabling easy understanding of key concepts. Homework problems, a solutions manual for instructors, and links to YouTube lectures accompany the book online. This is the 'go-to' guide for graduate students, researchers and industry practitioners interested in X-ray and EUV interaction with matter.




X-ray and Extreme Ultraviolet Optics


Book Description




Radiation characteristics of extreme UV and soft X-ray sources


Book Description

Electromagnetic radiation in the extreme UV and soft x-ray spectral range is of steadily increasing importance in fundamental research and industrial applications. An optimum use of the available photons can only be achieved under condition of a comprehensive beam characterization. Following that goal, this work addresses the pathway of extreme UV and soft x-ray radiation from its generation, through the beam transport by the beamline to the probe position. Experimentally, those aspects are optimized at a laser-produced plasma source and at an arrangement for the generation of high-harmonics. Additionally, the coherence of laser beams is analyzed by measurements of the Wigner distribution function. This method is applied to the photon beam of the free-electron laser FLASH, resulting in the entire characterization of its propagation properties.