Quantitative Electron Microscopy Studies of Si1̳-̳x̳Gex̳/Si(001)
Author : William Lee Henstrom
Publisher :
Page : 238 pages
File Size : 25,34 MB
Release : 2000
Category :
ISBN :
Author : William Lee Henstrom
Publisher :
Page : 238 pages
File Size : 25,34 MB
Release : 2000
Category :
ISBN :
Author : Josh Robert Cowell
Publisher :
Page : 276 pages
File Size : 19,15 MB
Release : 2013
Category :
ISBN :
Author : Zhiyong Ma
Publisher : CRC Press
Page : 843 pages
File Size : 26,70 MB
Release : 2017-03-27
Category : Science
ISBN : 135173394X
Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging—a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.
Author : M. Aindow
Publisher : CRC Press
Page : 548 pages
File Size : 42,29 MB
Release : 2001-12-01
Category : Science
ISBN : 1482289512
Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Electron Microscopy and Analysis 2001 presents a useful snapshot of the latest developments in instrumentation, analysis techniques, and applications of electron and scanning probe microscopies. The book is ideal for
Author : D. B. Holt
Publisher : Cambridge University Press
Page : 625 pages
File Size : 26,54 MB
Release : 2007-04-12
Category : Science
ISBN : 1139463594
A discussion of the basic properties of structurally extended defects, their effect on the electronic properties of semiconductors, their role in semiconductor devices, and techniques for their characterization. This text is suitable for advanced undergraduate and graduate students in materials science and engineering, and for those studying semiconductor physics.
Author :
Publisher :
Page : pages
File Size : 36,88 MB
Release : 2008
Category : Electron microscopy
ISBN : 9781605110028
Author : Symposium on Quantitative Electron Microscopy
Publisher :
Page : 605 pages
File Size : 11,26 MB
Release : 1965
Category : Electron microscopes
ISBN :
Author : Tatiana Gorelik
Publisher :
Page : 106 pages
File Size : 43,20 MB
Release : 2002
Category :
ISBN :
Author : D. B. Holt
Publisher :
Page : 570 pages
File Size : 32,42 MB
Release : 1976
Category :
ISBN :
Author :
Publisher :
Page : 11 pages
File Size : 41,75 MB
Release : 1965
Category :
ISBN :