Technical Digest : 2008, Hilton Head Island, South Carolina, June 1 - 5
Author : Kimberly L. Turner
Publisher :
Page : 404 pages
File Size : 41,76 MB
Release : 2008
Category :
ISBN :
Semiconductor Memories and Systems
Author : Andrea Redaelli
Publisher : Woodhead Publishing
Page : 364 pages
File Size : 19,93 MB
Release : 2022-06-07
Category : Technology & Engineering
ISBN : 0128209461
Book Description
Semiconductor Memories and Systems provides a comprehensive overview of the current state of semiconductor memory at the technology and system levels. After an introduction on market trends and memory applications, the book focuses on mainstream technologies, illustrating their current status, challenges and opportunities, with special attention paid to scalability paths. Technologies discussed include static random access memory (SRAM), dynamic random access memory (DRAM), non-volatile memory (NVM), and NAND flash memory. Embedded memory and requirements and system level needs for storage class memory are also addressed. Each chapter covers physical operating mechanisms, fabrication technologies, and the main challenges to scalability. Finally, the work reviews the emerging trends for storage class memory, mainly focusing on the advantages and opportunities of phase change based memory technologies. Features contributions from experts from leading companies in semiconductor memory Discusses physical operating mechanisms, fabrication technologies and paths to scalability for current and emerging semiconductor memories Reviews primary memory technologies, including SRAM, DRAM, NVM and NAND flash memory Includes emerging storage class memory technologies such as phase change memory
Physics and Technology of High-k Materials 9
Author : S. Kar
Publisher : The Electrochemical Society
Page : 504 pages
File Size : 43,91 MB
Release : 2011
Category :
ISBN : 1607682575
Book Description
Magnetic Memory
Author : Denny D. Tang
Publisher : Cambridge University Press
Page : 207 pages
File Size : 27,59 MB
Release : 2010-04-22
Category : Technology & Engineering
ISBN : 1139484494
Book Description
If you are a semiconductor engineer or a magnetics physicist developing magnetic memory, get the information you need with this, the first book on magnetic memory. From magnetics to the engineering design of memory, this practical book explains key magnetic properties and how they are related to memory performance, characterization methods of magnetic films, and tunneling magnetoresistance effect devices. It also covers memory cell options, array architecture, circuit models, and read-write engineering issues. You'll understand the soft fail nature of magnetic memory, which is very different from that of semiconductor memory, as well as methods to deal with the issue. You'll also get invaluable problem-solving insights from real-world memory case studies. This is an essential book for semiconductor engineers who need to understand magnetics, and for magnetics physicists who work with MRAM. It is also a valuable reference for graduate students working in electronic/magnetic device research.
3D Flash Memories
Author : Rino Micheloni
Publisher : Springer
Page : 391 pages
File Size : 23,36 MB
Release : 2016-05-26
Category : Computers
ISBN : 9401775125
Book Description
This book walks the reader through the next step in the evolution of NAND flash memory technology, namely the development of 3D flash memories, in which multiple layers of memory cells are grown within the same piece of silicon. It describes their working principles, device architectures, fabrication techniques and practical implementations, and highlights why 3D flash is a brand new technology. After reviewing market trends for both NAND and solid state drives (SSDs), the book digs into the details of the flash memory cell itself, covering both floating gate and emerging charge trap technologies. There is a plethora of different materials and vertical integration schemes out there. New memory cells, new materials, new architectures (3D Stacked, BiCS and P-BiCS, 3D FG, 3D VG, 3D advanced architectures); basically, each NAND manufacturer has its own solution. Chapter 3 to chapter 7 offer a broad overview of how 3D can materialize. The 3D wave is impacting emerging memories as well and chapter 8 covers 3D RRAM (resistive RAM) crosspoint arrays. Visualizing 3D structures can be a challenge for the human brain: this is way all these chapters contain a lot of bird’s-eye views and cross sections along the 3 axes. The second part of the book is devoted to other important aspects, such as advanced packaging technology (i.e. TSV in chapter 9) and error correction codes, which have been leveraged to improve flash reliability for decades. Chapter 10 describes the evolution from legacy BCH to the most recent LDPC codes, while chapter 11 deals with some of the most recent advancements in the ECC field. Last but not least, chapter 12 looks at 3D flash memories from a system perspective. Is 14nm the last step for planar cells? Can 100 layers be integrated within the same piece of silicon? Is 4 bit/cell possible with 3D? Will 3D be reliable enough for enterprise and datacenter applications? These are some of the questions that this book helps answering by providing insights into 3D flash memory design, process technology and applications.
Physics and Technology of High-k Materials 8
Author : Samares Kar
Publisher : The Electrochemical Society
Page : 621 pages
File Size : 10,7 MB
Release : 2010-10
Category : Science
ISBN : 1566778220
Book Description
The issue of ECS Transactions will cover comprehensively all the aspects of high-k material physics and technology: Diverse High Mobility Substrates, High-k Materials, Metal Gate Electrode Materials, Deposition Techniques, Bulk Material Properties, Flat-Band Voltage Issues and Control, Interfaces, Gate Stack Reliability, Electrical, Chemical, and Physical Chatracterization, Novel Applications, High-k and Diverse Insulators for Photonics, High-k Processing/ Manufacturing.
NAND Flash Memory Technologies
Author : Seiichi Aritome
Publisher : John Wiley & Sons
Page : 433 pages
File Size : 18,23 MB
Release : 2015-12-01
Category : Technology & Engineering
ISBN : 1119132622
Book Description
Offers a comprehensive overview of NAND flash memories, with insights into NAND history, technology, challenges, evolutions, and perspectives Describes new program disturb issues, data retention, power consumption, and possible solutions for the challenges of 3D NAND flash memory Written by an authority in NAND flash memory technology, with over 25 years’ experience
Handbook of Digital Imaging
Author : Michael Kriss
Publisher : John Wiley & Sons
Page : 1936 pages
File Size : 44,21 MB
Release : 2015-02-16
Category : Technology & Engineering
ISBN : 0470510595
Book Description
A comprehensive and practical analysis and overview of the imaging chain through acquisition, processing and display The Handbook of Digital Imaging provides a coherent overview of the imaging science amalgam, focusing on the capture, storage and display of images. The volumes are arranged thematically to provide a seamless analysis of the imaging chain from source (image acquisition) to destination (image print/display). The coverage is planned to have a very practical orientation to provide a comprehensive source of information for practicing engineers designing and developing modern digital imaging systems. The content will be drawn from all aspects of digital imaging including optics, sensors, quality, control, colour encoding and decoding, compression, projection and display. Contains approximately 50 highly illustrated articles printed in full colour throughout Over 50 Contributors from Europe, US and Asia from academia and industry The 3 volumes are organized thematically for enhanced usability: Volume 1: Image Capture and Storage; Volume 2: Image Display and Reproduction, Hardcopy Technology, Halftoning and Physical Evaluation, Models for Halftone Reproduction; Volume 3: Imaging System Applications, Media Imaging, Remote Imaging, Medical and Forensic Imaging 3 Volumes www.handbookofdigitalimaging.com
ESD
Author : Steven H. Voldman
Publisher : John Wiley & Sons
Page : 411 pages
File Size : 36,76 MB
Release : 2009-07-01
Category : Technology & Engineering
ISBN : 0470747269
Book Description
Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrical overstress, ESD, and latchup from a failure analysis and case-study approach. It provides a clear insight into the physics of failure from a generalist perspective, followed by investigation of failure mechanisms in specific technologies, circuits, and systems. The book is unique in covering both the failure mechanism and the practical solutions to fix the problem from either a technology or circuit methodology. Look inside for extensive coverage on: failure analysis tools, EOS and ESD failure sources and failure models of semiconductor technology, and how to use failure analysis to design more robust semiconductor components and systems; electro-thermal models and technologies; the state-of-the-art technologies discussed include CMOS, BiCMOS, silicon on insulator (SOI), bipolar technology, high voltage CMOS (HVCMOS), RF CMOS, smart power, gallium arsenide (GaAs), gallium nitride (GaN), magneto-resistive (MR) , giant magneto-resistors (GMR), tunneling magneto-resistor (TMR), devices; micro electro-mechanical (MEM) systems, and photo-masks and reticles; practical methods to use failure analysis for the understanding of ESD circuit operation, temperature analysis, power distribution, ground rule development, internal bus distribution, current path analysis, quality metrics, (connecting the theoretical to the practical analysis); the failure of each key element of a technology from passives, active elements to the circuit, sub-system to package, highlighted by case studies of the elements, circuits and system-on-chip (SOC) in today’s products. ESD: Failure Mechanisms and Models is a continuation of the author’s series of books on ESD protection. It is an essential reference and a useful insight into the issues that confront modern technology as we enter the Nano-electronic era.
Oxygen Compounds—Advances in Research and Application: 2013 Edition
Author :
Publisher : ScholarlyEditions
Page : 804 pages
File Size : 40,27 MB
Release : 2013-05-01
Category : Science
ISBN : 1490103155
Book Description
Oxygen Compounds—Advances in Research and Application: 2013 Edition is a ScholarlyBrief™ that delivers timely, authoritative, comprehensive, and specialized information about ZZZAdditional Research in a concise format. The editors have built Oxygen Compounds—Advances in Research and Application: 2013 Edition on the vast information databases of ScholarlyNews.™ You can expect the information about ZZZAdditional Research in this book to be deeper than what you can access anywhere else, as well as consistently reliable, authoritative, informed, and relevant. The content of Oxygen Compounds—Advances in Research and Application: 2013 Edition has been produced by the world’s leading scientists, engineers, analysts, research institutions, and companies. All of the content is from peer-reviewed sources, and all of it is written, assembled, and edited by the editors at ScholarlyEditions™ and available exclusively from us. You now have a source you can cite with authority, confidence, and credibility. More information is available at http://www.ScholarlyEditions.com/.
